Resonant nano three-coordinate touch probe based on fiber Bragg grating

A fiber-optic Bragg and resonant technology, applied in the field of nanometer three-coordinate measuring head, can solve complex processing and assembly problems, achieve good flexibility, small force measurement, and reduce anisotropy and measurement errors.

Inactive Publication Date: 2017-11-28
HEFEI UNIV OF TECH
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Problems solved by technology

The British Commonwealth Institute of Physics NPL has developed a probe based on piezoelectric ceramic dynamic sensing, which has studied the influence of the microscopic surface force of the probe. However, due to the use of MEMS technology to process the probe structure, its processing and assembly are quite complicated.

Method used

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  • Resonant nano three-coordinate touch probe based on fiber Bragg grating
  • Resonant nano three-coordinate touch probe based on fiber Bragg grating
  • Resonant nano three-coordinate touch probe based on fiber Bragg grating

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Embodiment Construction

[0027] see figure 1 and figure 2 , the structure of the fiber Bragg grating-based resonant nano three-coordinate touch probe in this embodiment is set as:

[0028] The integrated probe 1 with a ball head is fixed on the central point of the suspension support 3 in a "T" shape, and the support rods on the suspension support 3 in the same plane are radially distributed, and the flexible cantilever 2 and the suspension support The sharp centers of 3 are fixed together, and the distal ends of the flexible arms on the same plane on the flexible cantilever 2 are fixed on the outer connecting ring 8 to form a measuring probe. This flexible cantilever support is connected to the center of the suspension support at one point, and the arms are staggered. Change, the flexible cantilever supports the force arm to increase, and the distal end of the suspension support is not constrained by the flexible cantilever, so that the force measurement of this structure is smaller and the flexib...

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Abstract

The invention discloses a resonant nano three-coordinate contact measuring head based on fiber Bragg grating, which is characterized in that the structure of the measuring head is set as follows: an integrated probe with a ball head is fixed on a suspension bracket in a "T" shape The center point of the suspension bracket, the bracket rods in the same plane on the suspension bracket are radially distributed, the flexible cantilever and the center of the suspension bracket are fixed together, and the distal ends of the flexible arms in the same plane on the flexible bracket are fixed on the outer connection On the ring, it constitutes a measuring probe; the lower end of the FBG sensor set in the packaging layer is fixed on the far end of each support rod in the suspension bracket, and the upper end of the FBG sensor is fixed on the edge of the piezoelectric ceramic vibration plate, and the piezoelectric ceramic vibration plate passes through The thread is fixedly connected to the displacement output shaft of the piezoelectric ceramic, and the piezoelectric ceramic is fixedly connected to the bottom surface of the probe base through the thread. The invention has the advantages of high sensitivity, small measurement force, little influence of microscopic surface force, good long-term stability, good repeatability and small anisotropy.

Description

technical field [0001] The invention relates to a nano three-coordinate measuring head, more specifically a measuring head mechanism of a three-coordinate measuring machine used for nanoscale three-dimensional dimension measurement. Background technique [0002] In the past two decades, microelectronics technology has developed rapidly, and various microdevices have emerged, such as micromechanical parts, microelectromechanical systems MEMS, biomedical devices, and optical devices. The three-dimensional measurement of the geometric feature size of these micro-devices relies on the coordinate measuring machine CMM, but the positioning of each axis and the comprehensive accuracy of the traditional commercial three-coordinate measuring machine can only reach the micron level, which cannot meet the accuracy requirements of nanometer measurement; at the same time, the The diameter of the measuring head probe is relatively large, which cannot be used for small-sized three-dimensio...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01B11/00
Inventor刘芳芳陈丽娟王景凡夏豪杰李红莉
OwnerHEFEI UNIV OF TECH