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Bayesian Reliability Evaluation Method for Small Sample Products Based on Similar Product Information

A product information, Bayesian estimation technology, applied in instrumentation, design optimization/simulation, electrical digital data processing, etc., can solve problems such as large reliability model parameters, lack of stable life data, errors, etc.

Active Publication Date: 2020-04-17
SHANGHAI RADIO EQUIP RES INST
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

For products produced in single batches and small batches, there are few samples of the same type of products that can be obtained, and there is a lack of stable life data. Using conventional statistical analysis methods, the reliability model parameters are prone to large errors, which cannot reflect the product well. real reliability

Method used

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  • Bayesian Reliability Evaluation Method for Small Sample Products Based on Similar Product Information
  • Bayesian Reliability Evaluation Method for Small Sample Products Based on Similar Product Information
  • Bayesian Reliability Evaluation Method for Small Sample Products Based on Similar Product Information

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Embodiment Construction

[0077] The following combination figure 1 , to describe preferred embodiments of the present invention in detail.

[0078] Such as figure 1 Shown is the Bayesian reliability assessment method for small sub-sample products based on similar product information described in the present invention, wherein the product that needs to be evaluated for reliability is called this product, and other products that are similar to this product are called similar products , with the following steps:

[0079] S1. Carry out similarity scoring for different similar products, classify similar products with the same similarity as a priori sample, and determine the priori sample set;

[0080] S2. Obtain prior information, including failure life data of similar products and pseudo failure life data obtained by using performance degradation failure model;

[0081] S3. Using the two-parameter Weibull distribution as the overall distribution function, constructing Van Montfort statistics, verifying...

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Abstract

The invention relates to a similar product information-based bayesian reliability evaluation method of small number samples. The method comprises the steps of (S1) carrying out similarity scoring on similar products and determining a prior sample set; (S2) acquiring prior information, which includes failure life data and pseudo failure life data of the similar products; (S3) determining a prior distribution form; (S4) checking the failure mechanism consistency of the similar products; and (S5) determining prior distribution and posterior distribution and achieving bayesian reliability evaluation. According to the method provided by the invention, the sample quantity of the small number samples is effectively improved; and the prior information includes the failure life data and the pseudo failure life data and a two-parameter bayesian reliability evaluation problem is converted into single-parameter bayesian reliability evaluation, so that the bayesian reliability evaluation accuracy of the products is effectively improved and the calculation method of bayesian reliability parameter evaluation is simplified.

Description

technical field [0001] The invention relates to a small sample product Bayesian reliability evaluation method, specifically a small sample product Bayesian reliability evaluation method based on similar product information, and belongs to the technical field of reliability modeling and reliability evaluation. Background technique [0002] Satellites play a very important role in the aerospace field. Their reliability and life directly affect the satellite's attitude control, measurement accuracy and other indicators, and are the key to the success of space missions. Satellites are in orbit for a long time, which requires that the payload of the satellite must have high reliability and long life. Therefore, for satellite payloads, corresponding reliability work must be carried out at all stages of the life cycle. However, due to the high cost, complex system, and small sample size of the satellite payload itself, it is impossible to use a large number of products for life te...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F119/02
CPCG06F30/20
Inventor 李鸿志周郁黄勇张衡李雁斌张志俊
Owner SHANGHAI RADIO EQUIP RES INST
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