A vertical measurement method of three-dimensional surface shape based on s-transformation with structured light

A technology for three-dimensional surface shape and vertical measurement, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as inability to accurately reconstruct three-dimensional surface shapes, loss of object detail information, and little connection with Fourier transform, etc., to achieve Good application prospects, avoiding loss of details, and the effect of good time-frequency analysis characteristics

Active Publication Date: 2021-03-16
CHENGDU UNIV OF INFORMATION TECH
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Problems solved by technology

The Fourier transform method processes each frame of picture separately. This method belongs to the space-frequency global analysis technology. The interaction between each pixel and the filtering operation are likely to cause the loss of object detail information, which will seriously affect the measurement accuracy. Accuracy; although wavelet transform has multi-resolution characteristics and good time-frequency local analysis ability, it overcomes the defects of Fourier transform method and can adaptively reflect the low-frequency and high-frequency components of the fringe pattern, but it can only estimate the local Power spectrum, and has little connection with Fourier transform;
[0003] In summary, in the existing modulation degree measurement profilometry, single-frame fringe processing techniques including Fourier transform method and wavelet transform method are limited to varying degrees when extracting fringe modulation degree information, so it is impossible to accurately reconstruct the fringe Measure the three-dimensional surface shape of the object

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  • A vertical measurement method of three-dimensional surface shape based on s-transformation with structured light
  • A vertical measurement method of three-dimensional surface shape based on s-transformation with structured light
  • A vertical measurement method of three-dimensional surface shape based on s-transformation with structured light

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Embodiment Construction

[0058] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0059] In view of the many drawbacks of the prior art, the present invention designs a single-frame fringe analysis technology based on S-transform to extract modulation degree information in fringes. The S-transform method described in the present invention combines the advantages of windowed Fourier transform and wavelet transform, and can be...

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Abstract

The invention discloses a structured light three-dimensional surface shape vertical measurement method based on s transformation, and three-dimensional surface shape measurement can be realized by performing once scanning to simultaneously use s-transformation ridge extracting and s-transformation filtering methods to obtain distribution of bar chart modulation degree values. The s transformationis a lossless and reversible time-frequency analysis method, compared with wavelet transformation, the s-transformation ridge extracting method has the characteristic of multiresolution, the transformation coefficient is directly connected with the fourier frequency spectrum of the signal, more accurate modulation degree values can be obtained by the s-transformation ridge extracting method compared with the wavelet transformation, compared with fourier transformation, the s-transformation filtering method adopts a gaussian window function, the window width is in direct proportion to the inverse of the frequency, the defect that the window width is fixed is overcome, the time-frequency analysis characteristic is good, and the detail part of a measured object can be kept more completely. Bymeans of the method, the problem that the three-dimensional surface shape of the measured object cannot be accurately reconstructed in the prior art is solved, and the measuring precision is improved.

Description

technical field [0001] The invention relates to a structured light projection optical three-dimensional surface shape measurement technology, in particular to a structured light three-dimensional surface shape vertical measurement method based on S transformation. Background technique [0002] In the existing modulation degree measurement profilometry, the modulation degree information of the fringe can be obtained by using the multi-frame fringe processing technology and the single-frame fringe processing technology. In the multi-frame fringe processing technology, N (N≧3) frames of phase-shifted fringe images are collected for each position, and the modulation degree information is calculated using the N-step phase-shift method, but this method will increase the number of images collected during the scanning process, not only It affects the measurement speed, but also increases the number of images collected, which is not conducive to its practicability. In the single-fra...

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01B11/26
CPCG01B11/26
Inventor钟敏陈锋肖朝
OwnerCHENGDU UNIV OF INFORMATION TECH