Nonmetallic material defect detecting device and method

A non-metallic material, defect detection technology, applied in the field of non-metallic material defect detection device

Pending Publication Date: 2019-03-22
CHINA SPECIAL EQUIP INSPECTION & RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The invention provides a non-metallic material defect detection device and detection method to improve the uniformity of the excitation source to the test sample radiation; at the same time, it solves the refl

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  • Nonmetallic material defect detecting device and method
  • Nonmetallic material defect detecting device and method

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Embodiment Construction

[0039] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0040] The technical solution of the present invention and how the technical solution of the present application solves the above technical problems will be described in detail below with specific embodiments. The following specific embodiments may be combined with each other, and the same or similar concepts or processes may not be repeated ...

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Abstract

The invention provides a nonmetallic material defect detecting device and method. The device comprises an excitation source and an infrared thermal imager. The excitation source and a lens of the infrared thermal imager form a preset included angle. The excitation source is used for providing infrared light illuminating the surface of a nonmetallic sample. The infrared thermal imager is used for obtaining an infrared thermal image on the surface of the nonmetallic sample. Through the device, nonmetallic material defect detection is conducted, and the unevenness of radiation of the excitation source on the tested sample is reduced; meanwhile, the reflection problem of the excitation source on the surface of the tested sample is solved, the nonmetallic material defect detection accuracy andsensitivity are improved, and the false drop rate and omission rate are reduced.

Description

technical field [0001] The invention relates to the technical field of non-destructive testing, in particular to a non-metallic material defect detection device and detection method. Background technique [0002] With the rapid development of science and technology, non-destructive testing is an important means for modern industry to ensure product quality and safety performance and stabilize production processes. Commonly used non-destructive testing methods are eddy current testing, radiographic testing, ultrasonic testing, magnetic particle testing and liquid penetrant testing. [0003] In the prior art, the mid-infrared thermal wave detection technology has been rapidly developed due to its advantages of fast real-time, non-destructive, non-contact, no coupling, large area, and long-distance detection. It has wider applicability, can be used for metal and non-metal detection, can realize non-contact detection and online and in-service monitoring of operating equipment, ...

Claims

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Application Information

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IPC IPC(8): G01J5/00G01J5/08G01J5/04G01N21/88
CPCG01J5/00G01J5/04G01J5/0896G01N21/8806G01N21/8851G01J2005/0077G01N2021/8887G01J5/485
Inventor 俞跃周继雯
Owner CHINA SPECIAL EQUIP INSPECTION & RES INST
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