Quartz ring product thickness measuring device
A technology for thickness measurement and rings, which is applied in the field of thickness measurement devices for quartz ring products, can solve problems such as inconvenient operation, low measurement efficiency, and deviations in measurement conditions, and achieve time-saving, labor-saving, convenient operation, and error avoidance. Effect
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2020-12-01
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Abstract
Description
technical field
[0001] The invention relates to the technical field of measuring quartz ring products, in particular to a thickness measuring device for quartz ring products. Background technique
[0002] Quartz ring products are products processed by using quartz rings as the body, while quartz rings are originals made of mineral quartz as raw material, and quartz generally refers to low-temperature quartz, which is the most widely distributed mineral in the quartz group of minerals , whose main component is SiO2, colorless and transparent, often contains a small amount of impurity components, and turns into translucent or opaque crystals with a hard texture.
[0003] Most of the thickness measurements of quartz ring products on the market are measured by tools such as vernier calipers or measuring rulers. However, it is not convenient to operate during the measurement process with these tools, and it is necessary to keep the quartz ring products and measuring tools vertica...
Examples
Embodiment Construction
[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] see Figure 1-5 , the embodiment of the present invention provides a technical solution: a device for measuring the thickness of quartz ring products, including a base plate 1, a main rod 4, a placement plate 6, a measuring plate 2, a pressure plate 10, and a limit plate 14. The base plate 1 The top is connected to the main rod 4 by welding, the top of the bottom plate 1 is connected to the measuring board 2 by inlaying, the outside of the main rod 4 is...