Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High-precision temperature measurement and control method based on double feedback

A high-precision, dual-feedback technology, used in radiation pyrometry, temperature control, measurement devices, etc., can solve problems such as weak design and analysis capabilities, unfavorable engineering operations, and lack of accuracy, and achieve improved anti-interference capabilities, The effect of meeting imaging quality requirements and reducing time and cost

Active Publication Date: 2021-06-11
BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] As far as the complexity of the temperature control system model is concerned, the design and analysis capabilities of the thermodynamic model are weak at present. Generally, the project experience and the designer's debugging experience are used to complete the temperature control debugging. This method takes a long time and costs a lot. , Lack of accuracy, not conducive to engineering operation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-precision temperature measurement and control method based on double feedback
  • High-precision temperature measurement and control method based on double feedback
  • High-precision temperature measurement and control method based on double feedback

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0052] The present invention will be further elaborated below in conjunction with embodiment.

[0053] Such as Figure 13 , the specific process is as follows:

[0054]The first step, temperature data acquisition: in the near-focus plane temperature precise measurement circuit, the constant current drive temperature measurement part completes the constant current drive of the temperature sensor; the data conditioning part completes the secondary amplification of the temperature data analog quantity; the analog-to-digital conversion Complete the analog-to-digital conversion and filtering of temperature data with the digital filtering part to form the main feedback digital temperature data; transmit it to the high-precision temperature control part through the secondary bus, and feed back to the model recognition part to complete the system model recognition.

[0055] At the same time, the refrigeration controller completes the transmission of the temperature data analog quanti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a high-precision temperature measurement and control method based on double feedback, and the method comprises the steps: 1, temperature collection: providing constant-current drive for a temperature sensor through a constant-current drive temperature measurement part circuit, and designing a double-feedback temperature measurement mechanism to collect data, including main and auxiliary feedback temperature data; 2, temperature measurement data conditioning: extracting and amplifying the junction voltage of a temperature measurement diode by adopting two-stage amplification of a specific temperature zone, and completing two-stage amplification conditioning of temperature measurement data; 3, carrying out analog-to-digital conversion and digital filtering; 4, identifying the model; and 5, temperature control: designing a parallel control switching scheme to select temperature measurement data, optimizing a temperature control algorithm and performing fixed-point processing on algorithm parameters, and evaluating a high-precision temperature control effect of a real controlled object according to temperature control precision. The dual feedback provides dual reliability guarantee for the feedback source of the temperature control system, in addition, the anti-interference capability of temperature measurement is also improved by the nearest digital scheme of the main feedback, and high-precision temperature measurement assistance is provided for the high-precision temperature control effect.

Description

technical field [0001] The invention belongs to the technical field of temperature control of space optical remote sensors, in particular to a high-precision temperature measurement and control method based on double feedback. Background technique [0002] The temperature control accuracy and stability of the focal plane detector components in infrared remote sensing cameras directly affect the quality of camera imaging. With the increasing imaging quality requirements of optical remote sensing satellites, the requirements for detector temperature control technology are getting higher and higher. In the cold environment of deep space, the background noise received by the focal plane detector is very small, and the thermal radiation generated by the optical lens itself will become the main source of noise. The detector is maintained in a certain low temperature range with high precision, which can effectively improve the sensitivity of the detector. [0003] Commonly used re...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05D23/20G01J5/06
CPCG05D23/20G01J5/061
Inventor 汪瑜何海燕李寅龙耿振华张凤刘志宏张晗常霞史翠红谢妮慧久元溦翟耘萱
Owner BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products