597 results about "Focal plane detector" patented technology

The multi-target tracking and discrimination system (MOST) fuses with and augments existing BMDS sensor systems. Integrated devices include early warning radars, X-band radars, Lidar, DSP, and MOST which coordinates all the data received from all sources through a command center and deploys the GBI for successful interception of an object detected anywhere in space, for example, warheads. The MOST system integrates the optics for rapid detection and with the optical sensor array delivers high-speed, high accuracy positional information to radar systems and also identifies decoys. MOST incorporates space situational awareness, aero-optics, adaptive optics, and Lidar technologies. The components include telescopes or other optical systems, focal plane arrays including high-speed wavefront sensors or other focal plane detector arrays, wavefront sensor technology developed to mitigate aero-optic effects, distributed network of optical sensors, high-accuracy positional metrics, data fusion, and tracking mounts. Field applications include space monitoring, battlefield artillery, battlefield management, ground defense, air defense, space protection, missile defense, gunfire detection, and the like.

Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of substantially collimated light characterized by a temporally dependent spectrum. The beam is focused in a plane characterized by a fixed displacement along the propagation axis of the beam, and scattered light from the sample is superposed with a reference beam derived from the substantially collimated source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measured data to structure of an object to allow solution of an inverse scattering problem based upon the interference signal so that a three-dimensional structure of the sample may be inferred in near real time.

The invention discloses a non-refrigeration infrared detector, and especially disclsoes a microbridge structure and a two-dimension focal plane array comprised of the microbridge structure. The microbridge structure includes a semiconductor substrate, a cantilever beam hierarchic microstructure made above the substrate, a blind pixel hierarchic microstructure made above the substrate, and a pixel hierarchic microstructure made above the blind pixels and the cantilever beam. The pixels and the blind pixels are integrated at the same position on the substrate in the microbridge structure in a three-dimensional way, so the disadvantage of the pixels and the blind pixels being in different temperature gradients due to being at different positions far from each other on the substrate in conventional non-refrigeration infrared detectors is effectively avoided. The one-to-one corresponding relationship of the pixels and the blind pixels is realized using the above focal plane detector with the microbridge structures, and the one-to-one corresponding relationship will effectively improve a background correction function of the non-refrigeration detector and has great help in improving the performance of the detector.

The invention provides a method for correcting a non-uniformity fingerprint pattern on the basis of the infrared focal plane, belonging to the technical field of infrared imaging and aiming to carry out the non-uniformity correction on the infrared images acquired by an uncooled infrared focal plane detector under the condition that no background frame is available. The method of the invention comprises the following steps: raw data acquisition, non-uniformity fingerprint extraction and correction treatment, wherein the non-uniformity fingerprint refers to that each infrared focal plane detector has relatively stable non-uniformity modes and temperature-dependent rules which go under the general name of non-uniformity fingerprint. By pre-estimating the non-uniformity modes and rules, the method is capable of carrying out the non-uniformity correction on the actual infrared images acquired by the infrared focal plane detector. Compared with the conventional method for correcting the non-uniformity of the infrared focal plane, the invention can effectively reduce the size of the detection device and dispense with the background frame acquired by using a uniform baffle at each time of correction according to the conventional method, thereby greatly simplifying the correction process.

The invention relates to a method for manufacturing microbridge of uncooled infrared focal plane detector and a structure thereof.The method comprises the following steps: preparing a reflecting layer on a readout circuit-based wafer;an insulated medium layer,a first sacrificial layer and a first supporting layer;etching the first supporting layer and preparing a first through hole above the reflecting layer;preparing a fist electrode,a first medium layer,a first passivation layer, a second sacrificial layer,a second supporting layer,a thermal layer and a protective layer;etching the second supporting layer and preparing a second through hole above the first electrode;etching the protective layer and preparing a contact hole above the thermal layer;preparing a second electrode, a second medium layer, a second passivation layer,a third sacrificial layer,a third supporting layer and a third passivation layer successively;releasing respective sacrificial layers to get the detector structure.With the three-layer microbridge structure,the method for manufacturing microbridge of uncooled infrared focal plane detector increases effective filling factors and makes infrared absorption more efficient.

The invention relates to an infrared two-point non-uniform calibrating method based on a frame black body field diaphragm, belonging to the field of infrared thermal imaging. The method comprises the following steps of: arranging an automatically-telescopic frame black body field diaphragm on a diaphragm of an infrared thermal imager and performing two-point calibration under a frame to obtain a gain calibration factor and an offset calibration factor of a detection unit under the coverage of a frame black body; acquiring f frames of initially-calibrated images respectively on two scenes to obtain f-1 groups of inter-frame displacement parameters on every scene; and acquiring calibration parameters of f-1 groups of images with inter-frame displacement on an internal detection unit by adopting an algebraic method, and averaging the frames to obtain finial calibration matrixes G and 0 for calibrating the entire field of a subsequent infrared video. The method has the advantages of rapidness, self-adaption and system miniaturization, and can be applied to the fields of designing, production and manufacturing of refrigerating and non-refrigerating infrared focal plane detector thermalimaging systems, satellite infrared thermal imaging systems, infrared alarm systems, scientific researches and the like.

The present invention relates to a staring infrared focal plane detector adaptive non-uniformity correction method. It is characterized by that it uses the parameters of three fields of environmental temperature, prestored several parameter matrixes and image matrix obtained by detector as calculation basis of compensation algorithm, makes the preset correction parameters under the different working conditions and image matrix actually collected by detector undergo the process of algorithm iteration and utilizes the calculated result to adaptively correct current correction parameter matrix of detector.

The present invention provides an infrared focal plane array nonuniform self-adapting correcting method pertaining to the field of infrared focal plane detector and the aim of the invention resides in controlling the degenerating of the object, improving the calculating speed and simplifying the hardware realization. The present invention includes an initialization step, a pre-processing step, a coarse correcting step and an exact correcting step. The method adopts an arithmetic combining one point correcting and a self-adapting correcting of neuronic network and containing an edge extracting module and a combined correcting arithmetic is obtained by combining the excellence of each arithmetic, thus, the space low-frequency noise is eliminated effectively and the object degenerating is controlled and the calculating speed is improved comparing to the neuronic network arithmetic directed by the edge.

The invention discloses an uncooled infrared focal plane detector image processing system and method. The uncooled infrared focal plane detector image processing method includes a nonuniformity correction method, a blind unit correction method, an image filtering and denoising method, an image enhancement method and a pseudo color transforming method. By the system and method, nonuniformity and invalid pixel units can be processed, high image resolution of actual temperature during infrared imaging is improved, noise of images, image contrast and image gray scale ranges can be processed, and the images can be clearer.

The invention relates to a system for imaging detection of gas leakage based on a broadband uncooled focal plane detector. The system comprises a broadband infrared optical lens, a narrow-band optical filter shifter, a broadband uncooled focal plane detector, an image processing module, a control module and a displayer. Positional relations of the above devices are that the broadband infrared optical lens, the narrow-band optical filter shifter, and the broadband uncooled focal plane detector are disposed in sequence along a light path of incident light, and meanwhile, the image processing module is connected with the broadband uncooled focal plane detector, the displayer is connected with the image processing module, and the control module is connected with the narrow-band optical filter shifter. The system for imaging detection of gas leakage uses a plurality of narrow-band filters with different central wavelengths to select the central wavelengths of infrared light which enters the broadband uncooled focal plane detector, so that the system can detect the infrared lights with different kinds of central wavelengths and realize detection effect of broadband.

An embodiment of the invention discloses a correcting device of a thermal infrared imager. The correcting device comprises a first driving device, a first black body blocking piece, a second driving device, a second black body blocking piece and a controller, wherein the first black body blocking piece is provided with a first temperature and connected to an output end of the first driving device; the second black body blocking piece is provided with a second temperature and connected to an output end of the second driving device; and the controller is connected to the first driving device and the second driving device, controls the first black body blocking piece to move between a first position and a second position, and controls the second black body blocking piece to move between a third position and a fourth position. According to the correcting device of the thermal infrared imager, the first black body blocking piece and the second black body blocking piece respectively move to the position between an infrared focal plane detector and an infrared lens to obtain a first infrared original image and a second infrared original image, so that correcting parameters of infrared images are obtained. Therefore, the correcting device can perform correcting parameter update on the thermal infrared imager in real time to adapt to different conditions and environment changes.

The invention provides a two-waveband infrared optical system, belongs to an infrared remote sensing optical system, and solves the problems of limited optical path layout of the conventional map-integrated device and large volume of the entire device. The system comprises a scanning rotating mirror, a two-waveband infrared optical lens, a spectrometer, an infrared focal plane detector and a signal processor, wherein the two-waveband infrared optical lens consists of an infrared window, a beam splitter, a medium wave lens and a long wave lens; the scanning rotating mirror is positioned above the infrared window; an infrared optical fiber transmits infrared light output by the medium wave lens to the spectrometer; the infrared focal plane detector is positioned on an output optical axis of the long wave lens; and output signals of the spectrometer and the infrared focal plane detector are transmitted to the signal processor through a transmission cable. The system has small volume, high integration level, and convenient and flexible use, can realize automatic scanning, identification and track of a target by observing two wavebands of external scenery, and can be effectively applied to military or civil fields of missile infrared guidance, atmospheric pollution, remote measurement of poisonous gas and the like.

The invention relates to a method for detecting the surface shape of a large-aperture telescope by using phase diversity phase retrieval. The method comprises the following steps of: representing a 2-bit variable by using a 1-bit variable in order to representing an imaging relation of an optical system; expanding a wave aberration into a series, solving a transfer function by using self-correlation operation of a pupil function and changing a Zernike coefficient so as to obtain different transfer function calculating results, comparing the transfer function calculating results with a transfer function result acquired from the Fourier transform of a measured point spread function, using a minimum mean square error result as a solution; and solving an evaluation value E. The method for detecting the surface shape of a spherical mirror on the basis of phase diversity phase retrieval in a focal plane detector is low in development cost, simple in hardware, susceptible of influences of environment (especially vibration), and capable of dynamically detecting optical elements and systems.

It has been found that target optics produce non-specular, augmented optical returns when interrogated by a laser pulse. This non-specular radiation is detected by an active laser search system employing a direct-reading, thresholded focal plane detector that is able to detect non-cooperating targets with optics that employ a detector or optical element at the focal plane of their receiving optics. The pulses returned from such target optics have a width commensurate with the original transmitted pulse width, whereas passive background noise and the spread out active returns from the ground exhibit temporally long returns. By setting the sensor threshold sufficiently high, the system discriminates against noise and clutter while at the same time reducing the number of sweeps required to detect a target within the search area.

The invention discloses a two-waveband common-path and common-focal-plane imaging system, belongs to the technical field of optics and aims at solving the problems of poor quality, large size, long length, difficulties in eliminating stray light and the like in the prior art. The two-waveband common-path and common-focal-plane imaging system comprises a main mirror, a secondary mirror, a relay lens group and a focal plane detector. The main mirror, the secondary mirror, the relay lens group and the focal plane detector are on the identical optical axis, the reflecting surface of the main mirror and the reflecting surface of the secondary mirror are arranged oppositely, the main mirror is provided with a central hole, the relay lens group and the focal plane imaging detector are arranged inside the central hole of the main mirror, the relay lens group is arranged between a first image surface and the focal plane detector, and the main mirror and the secondary mirror are of a Cassegrain structural form. The two-waveband common-path and common-focal-plane imaging system utilizes the reflecting mirrors to fold light paths, so that the size and the weight of the lens can be reduced, the length can be fabricated to smaller than 0.6 time of the focal length; and by means of the secondary imaging mode, the elimination of the stray light becomes easy.

The invention discloses an uncooled infrared focal planedetector pixel and a preparation method thereof, and belongs to the technical field of uncooled infrared focal planedetectors. The uncooled infrared focal planedetector pixel sequentially comprises three layers of structures from a semiconductor substrate to the top; the bridge leg structure on the first layer comprises a metal reflection layer, an insulation dielectric layer, a first support layer, a first support layer protection layer, a first metal electrode layer and a first silicon nitridedielectric layer; the thermal conversion structure on the second layer comprises a second support layer, a second support layer protection layer, a thermosensitive layer, a thermosensitive layer protection layer, a second metal electrode layer and a second silicon nitridedielectric layer; the absorption layer structure on the third layer comprises a third support layer, an absorption layer and an absorption layer protection layer. The invention further discloses the preparation method of the novel uncooled infrared focal planedetector pixel. According to the uncooled infrared focal planedetector pixel,absorptivity of infrared radiation can be significantly increased, responsivity of a detector is increased, and a foundation is laid for manufacturing detectors which are larger in array and smaller in pixel.

The invention discloses a temperature controlled focal plane detector mechanism, which mainly solves the problem that the conventional focal plane detector mechanism cannot work under different temperature conditions. The temperature controlled focal plane detector mechanism comprises a shell, a cabinet, a detector and a detector mounting base, wherein the detector mounting base comprises a detector support plate and a cold plate; the detector support plate is fixedly connected with the cabinet; the detector is arranged on one side of the cold plate, and is provided with a temperature test sensor; the other side of the cold plate is provided with a refrigerator of which the side far from the cold plate is provided with a heat conducting device; and the heat conducting device and the cold plate isolate and seal the refrigerator. The temperature controlled focal plane detector mechanism can meet the requirements of different working temperatures of the detector; and the detector is not influenced by frosting and pollution when working in various environments (laboratories or space environments), and the environmental heat leak is effectively reduced.

The invention discloses a two-point linear and target and environment-based binary non-linear infrared detector heterogeneity correction method. The two-point linear and target and environment-based binary non-linear infrared detector heterogeneity correction method comprises two-point linear heterogeneity correction and target and environment-based binary non-linear heterogeneity correction. The two-point linear heterogeneity correction comprises the following sub-steps of enabling a focal plane and a plane blackbody origin to be aligned through an optical system; calculating a response mean value of every detection element under high and low temperature and response mean values of all detection elements; calculating correction gain and offset of every detection element, and respectively storing inside a lookup table for utilization during correction; correcting the infrared image according to the gain and an offset coefficient in an LUT (Lookup Table). According to the two-point linear and target and environment-based binary non-linear infrared detector heterogeneity correction method, the response characteristics of a focal plane detector are completely described, different requirements on accuracy of resource expenditure, power consumption and application occasions are fully taken into consideration, the imaging quality of an infrared thermal infrared imager can be effectively improved, and the focal plane heterogeneity is reduced.

The invention relates to a method for enhancing details and compressing a dynamic range of an infrared image. The method comprises the following steps: 1, an original infrared image with high dynamic range is resolved into a base graph and a detailed graph through a Gauss constrained filter; 2, performing dynamic saturation extraction and non-linear dynamic range compression on the base graph and the detailed graph; and 3, synthesizing the base graph and the detailed graph and outputting. The method can be used in various infrared focal plane detector imaging systems, is easy for hardware implementation, can be widely applied in the fields of infrared warning systems, infrared night version systems, space infrared imaging study, industrial and civil infrared imaging systems and the like, and provides quick and effective infrared image detail enhancement technical means.

The invention belongs to the technical field of photoelectronic imaging and relates to a novel focal plane array electrical interconnection process which solves the problem of increase of thermal conductance caused by deformation of indium columns during cold welding of a focal plane detector. The focal plane array electrical interconnection process includes the steps: firstly, a photoetching process on a read-out circuit of the focal plane detector; secondly, a metal membrane deposition process, namely depositing a nickel or copper metal membrane and then depositing an indium metal membrane, wherein the nickel or copper metal membrane is thicker than the indium metal membrane; thirdly, a photoresist stripping process on the read-out circuit; fourthly, an indium column reflux balling process on the read-out circuit; fifthly, an electrode manufacturing process on a focal plane chip; and sixthly, a cold welding interconnection process of the focal plane chip and the read-out circuit. Since nickel or copper is used as indium column support and electrical communication metal, the problem of increase of thermal conductance caused by deformation of indium columns during cold welding interconnection is avoided, and performances of the focal plane array detector are improved.

The invention discloses a supporting mechanism for a cooling platform of a cryostat of a focal plane detector. The supporting mechanism consists of a spindly thin wall cylindrical supporting column and four inclined pull type tinsels provided with prills on the two ends. The supporting column is arranged inside a boom-type casing of the cryostat, a cooling platform is supported by the supporting column fixed through weld, the four angles of the cooling platform are separately connected with tinsel, the connection between the tinsel and the cooling platform is spherical pair connection, and the other end of the tinsel is connected with an active and fixing column screwed on the side wall of a feed through collar in downward and inclined pull type and with spherical pair. The screwing screw is the screw for screwing the active and fixing column and the feed through collar, and is also the screw to load the pretightening force for the inclined type tinsel, and a screw cap for fixing the pretightening force is sleeved outside the screw. The invention has the advantages that the supporting mechanism overrides the abuse of the traditional cooling platform supporting structure on dynamics, and ensures that the detector is within the allowed error range of the optical system focal plane. The inclined pull type tinsel is connected with the active and fixing column and the cooling platform by adopting the spherical pair connection, when continuous outer impulsion and disturbance are received, the connecting part can be moved freely, and no fatigue bruising is created to cause breakage.

This invention relates to an optical spectrum instruments of digital microscope multi-imaging, which comprises subsystems of imaging, dimensionality compression, dispersion and collection of spectrum and feedback of digital microscope circuit, wherein, the imaging subsystem comprises pre-telescope, digital microscope, collimation lens and focusing lens; the dimensionality compression subsystem comprises cylindrical micro-lens array and cylindrical lens; feedback subsystem of digital microscope circuit comprises spectroscope, focal plane detector, data gathering chip, digital image processor, computer and digital microscope driver. The invention can rapidly chose a plurality of point objects in large angular field without scanning, and can eliminate the influence of ambient light to improve the system signal-to-noise ratio.

The invention discloses an infrared focal plane array imaging demonstrating system. Said system comprises an infrared radiating resource, infrared optical lens, an infrared focal plane detector, a programmable infrared detector driver, a high-speed interface, a high-speed data collecting card, a main processing unit and a high-functional computer. The infrared radiation is focalize on the infrared focal plane detector via the infrared optical lens; each unit on the infrared focal plane detector can convert the infrared radiating signal into electrical signal driven by driving and offset signals provided by the programmable infrared detector driver; clock and triggering signal needed by the programmable infrared detector driver is set by program programming of the high-functional computer which is transmitted to the programmable infrared detector driver by the main processing unit, high-speed data collecting card and high-speed interface. This invention enables designing stuff intuitively observe and evaluate the real imaging effect of the designed system and arithmetic and timely rectify and check the design and arithmetic, avoiding all sorts of troubles during process of system debugging.

An optical path structure of Fourier transform imaging spectrograph with high resolution and large field in total reflection type is prepared for imaging object on one-dimensional slit by three-reflection mode (TRM) pre-telescope, projecting slit image on Fresenel double-surface mirror and cutting slit image to be two correlation beams with certain cut angle, making two said beam be parallel beam after they are passed through TRM post collimator then projecting it to TRM cylindrical mirror in certain angle, focusing and projecting to surface of focal-plane detector for forming one-dimensional interference fringe and another-dimensional grey image distribution.

The invention discloses a poly-lens profound hypothermia infrared detector pipe casing structure packaged in a Dewar. The poly-lens profound hypothermia infrared detector pipe casing structure is applicable to the packaging technology of a profound hypothermia pipe casing arranged in an infrared focal plane detector Dewar and provided with a plurality of cold optical elements. The poly-lens profound hypothermia infrared detector pipe casing structure comprises a detector chip, an electrode lead wire circuit substrate, a plurality of lenses, an optical filter, a supporting pipe casing, a press ring type cold shield, a chip, a lead wire silicon-aluminum wire and the like. The poly-lens profound hypothermia infrared detector pipe casing structure achieves poly-lens profound hypothermia pipe casing high-accuracy packaging through special measures and structural modes such as laser positioning drilling, the nested press ring type cold shield, the special alloy integrated supporting pipe casing and lateral surface fine tuning aligning, can effectively meet hypothermia infrared optical accuracy requirements, reduce the background in a chip view field, stray light and heat radiation of the whole Dewar and effectively remove low temperature deformation stress of the ceramic sintered pipe casing on the detector chip, and is applicable to other radiation cooling, thermoelectric refrigerating and the like.

The invention discloses an Archimedes spiral push-scan filtering differential gas leakage infrared imaging method which is suitable for an infrared focal plane detector. The method comprises the following specific steps: (1). designing an Archimedes spiral filter disk including a background optical filter, a leakage gas optical filter and two light barrier sheets, wherein the optical filters and the light barrier sheets are arranged in an alternative manner; (2). obtaining a leakage gas image, a background image and light barrier images A and B by using the filter disk to perform push-scan on the detector; (3). performing difference operation between the leakage gas image and the A and the B respectively, obtaining an average difference result and then obtaining a leakage gas image without blind elements; and performing difference operation between the background image and the A and the B respectively, obtaining an average difference result and then obtaining a background image without blind elements; (4). using the A and the B for calculating a non-uniformity correction model and performing non-uniformity correction on the results obtained in step three; and (5). carrying out difference operation between the corrected leakage gas image and the corrected background image and obtaining a final image. The method provided by the invention is suitable for differential infrared imaging of a leakage gas.

The invention belongs to the technical field of image processing, and particularly relates to a multi-point correction method for an infrared focal plane. The method comprises steps as follows: step 1, an infrared focal plane detector acquires images of different temperature black bodies at the working temperature in every other 5 DEG C and uses the images as background images; step 2, a shutter is started, a related parameter of a shutter image is acquired, and a shutter correction parameter is acquired with the following formula shown in the specification according to the background images, wherein delta O is the shutter correction parameter, the related parameter of the shutter image comprises the mean value Xs of a shutter image Xs and the shutter image, Bi is the i background image, Bi is the mean value of the background images, Ks is a gain correction parameter corresponding to the shutter image, and Ks is the mean value of the Ks; step 3, according to the shutter correction parameter delta O, a gain correction parameter K and a bias correction parameter Bj which correspond to an object image are introduced into the following formula shown in the specification for two-point correction, and a corrected image Y is calculated, wherein X is the to-be-corrected image, Y is the corrected image, delta O is the shutter correction parameter, Bj is the j background image, and K is the gain correction image.

The invention discloses indium columns for the face-down bonding interconnection of an infrared focal plane and a preparation method thereof. In the method, the spin coating of photoresist and independent exposure are performed twice respectively on a chip of which the indium columns are needed to be prepared, the photoetching of indium column holes are performed by a one-time development method,the chip is positioned right above an indium evaporation source during high-vacuum thermal evaporation deposition of indium layers, and a novel indium column array is obtained in the mode of stripping the grown indium layers by using an organic reagent in a wet process. By the preparation method, the novel indium column array with large bottom size, small top size and high height consistency can be obtained, and the preparation requirement of the indium column array of a small-center distance focal plane detector can be met. The prepared indium columns cannot be contacted with the photoresistin the growth process, the generation of indium oxide or the carbonization of the photoresist due to the contact between a high-temperature indium source and the photoresist in the growth process canbe prevented, and redundant indium layers can be removed by a method of wet stripping by using the organic reagent, so that redundant residues are prevented from being attached to the surfaces of theindium columns.

The invention discloses an infrared focal plane detector with antireflex and collecting microlens and the microlens preparing method. And the detector comprises: infrared photosensitive pixel array chip, read circuit, mixed interconnected indium columns, and antireflex and collecting microlens array, where the antireflex and collecting microlens array is formed by growing an antireflex coating on the back of the substrate of the infrared photosensitive pixel array chip and combining and etching by routine plasma; and the microlens preparing method adopts a photoetching process memorizing the front side figure of focal plane detecting chip, where each optical axis of the obtained back-integrated microlens array is spatially superposed with the central normal of photosensitive surface of a corresponding photosensitive pixel. And its advantages: able to strengthen photocurrent signals of new- generation high density pixel infrared focal plane detectors and reduce space crosstalk between adjacent pixels.