Temperature controlled focal plane detector mechanism

A technology of detectors and temperature focal surfaces, applied in the direction of instruments, temperature control, non-electric variable control, etc., can solve problems such as unsatisfactory, achieve the effects of reducing pollution, high reliability, and reducing heat conduction and heat leakage

Inactive Publication Date: 2010-08-25
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The invention provides a temperature-controllable focal plane detector mechanism, which mainly solves the problem that the existing focal plane detector mechanism cannot work under different temperature conditions

Method used

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  • Temperature controlled focal plane detector mechanism

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Embodiment Construction

[0024] The present invention is described in detail below in conjunction with accompanying drawing, as figure 1 Shown:

[0025] The temperature-controllable focal plane detector mechanism includes a housing 1, a chassis 2, a detector 3 and a detector mounting seat 4. The inner surface of the housing 1 can be gold-plated or aluminum-plated, which can reduce radiation heat leakage and Infrared emissivity;

[0026] The outer shell 1 is provided with a heat insulating material 5, which is a multi-layer heat insulating material or a foam heat insulating material, which reduces the impact on the surrounding environment; the chassis 2 is fixed in the shell 1, and the 1. It is fixedly connected through the heat insulation pad 6; the light inlet of the chassis is provided with a transparent observation window 7 corresponding to the observation position of the detector, so that the surface of the detector is affected by frost, fog and pollution when it is cooled, so that the surface of...

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Abstract

The invention discloses a temperature controlled focal plane detector mechanism, which mainly solves the problem that the conventional focal plane detector mechanism cannot work under different temperature conditions. The temperature controlled focal plane detector mechanism comprises a shell, a cabinet, a detector and a detector mounting base, wherein the detector mounting base comprises a detector support plate and a cold plate; the detector support plate is fixedly connected with the cabinet; the detector is arranged on one side of the cold plate, and is provided with a temperature test sensor; the other side of the cold plate is provided with a refrigerator of which the side far from the cold plate is provided with a heat conducting device; and the heat conducting device and the cold plate isolate and seal the refrigerator. The temperature controlled focal plane detector mechanism can meet the requirements of different working temperatures of the detector; and the detector is not influenced by frosting and pollution when working in various environments (laboratories or space environments), and the environmental heat leak is effectively reduced.

Description

technical field [0001] The invention relates to a temperature-controllable focal plane detector mechanism, in particular to a temperature-controllable focal plane detector mechanism of an optical system, which can be applied in a vacuum environment. Background technique [0002] High-performance space cameras or space telescopes have different operating temperature requirements in different working modes and different working environments. For example, the focal plane needs to be cooled to a lower temperature (-50°C to -150°C, etc.) during imaging and observation, and in some test modes, the detector needs to work in a normal temperature environment (such as 10°C to 40°C, etc.) . [0003] When the detector drops from normal temperature to low temperature, some volatile substances such as printed boards and glue, and water vapor in the air will condense on the detector with a lower temperature, which will affect the performance of the detector. [0004] In addition, the tem...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05D23/20
Inventor 杨文刚解永杰樊学武凤良杰汶德胜
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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