Method for correcting non-uniformity fingerprint pattern on basis of infrared focal plane

An infrared focal plane and non-uniformity technology, applied in the field of infrared imaging, can solve problems such as unfavorable system real-time processing, artifacts, and target degradation

Active Publication Date: 2010-07-14
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0009] Analyze the two types of non-uniformity correction methods in the past. Calibration-based correction methods, such as the two-point method, due to the response drift of IRFPA, the actual correction needs to use a uniform reference source as a baffle to periodically collect surface source blackbody images as a background The frame is used for calibration, otherwise there will be a large residual error after correction; the adaptive correction method based on the scene class, such as the neural network correction method, requires a large amount of calculation when applied, which is not conducive to the real-time processing of the system, and often still after correction. Problems such as target degradation and artifacts can occur

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  • Method for correcting non-uniformity fingerprint pattern on basis of infrared focal plane
  • Method for correcting non-uniformity fingerprint pattern on basis of infrared focal plane
  • Method for correcting non-uniformity fingerprint pattern on basis of infrared focal plane

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[0074] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in detail, wherein selected the IRFPA (the unit of temperature in the present invention is degree Celsius) that actual specification is R * C = 288 * 384.

[0075] (1) Raw data collection steps. Collection method: put the infrared focal plane detector in a constant temperature box, and the temperature of the constant temperature box can be adjusted within a certain temperature range. The surface source blackbody temperature is constant at T B = 40 degrees, the lower limit of the ambient temperature of the incubator T SL = -40 degrees to the upper limit of ambient temperature T SH = 20 degrees, infrared focal plane detector at every interval ΔT S The ambient temperature increment of =10°C collects surface source blackbody images as experimental data. The acquisition time t of the infrared focal plane detector is the same at each ambient temperature, which is 4800...

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Abstract

The invention provides a method for correcting a non-uniformity fingerprint pattern on the basis of the infrared focal plane, belonging to the technical field of infrared imaging and aiming to carry out the non-uniformity correction on the infrared images acquired by an uncooled infrared focal plane detector under the condition that no background frame is available. The method of the invention comprises the following steps: raw data acquisition, non-uniformity fingerprint extraction and correction treatment, wherein the non-uniformity fingerprint refers to that each infrared focal plane detector has relatively stable non-uniformity modes and temperature-dependent rules which go under the general name of non-uniformity fingerprint. By pre-estimating the non-uniformity modes and rules, the method is capable of carrying out the non-uniformity correction on the actual infrared images acquired by the infrared focal plane detector. Compared with the conventional method for correcting the non-uniformity of the infrared focal plane, the invention can effectively reduce the size of the detection device and dispense with the background frame acquired by using a uniform baffle at each time of correction according to the conventional method, thereby greatly simplifying the correction process.

Description

technical field [0001] The invention belongs to the technical field of infrared imaging, and in particular relates to a correction method based on an infrared focal plane non-uniformity fingerprint mode. Background technique [0002] With the development of infrared detectors, infrared imaging systems have also been developed. In the first-generation infrared imaging system, a linear detector is used to scan and image through a one-dimensional optical machine. In the mid-1970s, the appearance of the IRFPA (Infrared Focal Plane Array, infrared focal plane array) detector marked the birth of the second-generation infrared imaging system—the staring infrared imaging system. Compared with linear detectors, focal plane detector imaging has the advantages of high spatial resolution, strong detection capability, and high frame rate, and is rapidly becoming the mainstream device of infrared imaging technology. At present, the staring infrared imaging system has begun to be widely ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/52H04N5/33
Inventor 张天序张春晓杨超桑红石颜露新袁雅婧刘慧娜周泱
Owner HUAZHONG UNIV OF SCI & TECH
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