Method for correcting non-uniformity fingerprint pattern on basis of infrared focal plane

An infrared focal plane and non-uniformity technology, applied in the field of infrared imaging, can solve problems such as unfavorable system real-time processing, artifacts, and target degradation
CN101776486AActive Publication Date: 2010-07-14HUAZHONG UNIV OF SCI & TECH
0 Cites 38 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
HUAZHONG UNIV OF SCI & TECH
Publication Date
2010-07-14

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention provides a method for correcting a non-uniformity fingerprint pattern on the basis of the infrared focal plane, belonging to the technical field of infrared imaging and aiming to carry out the non-uniformity correction on the infrared images acquired by an uncooled infrared focal plane detector under the condition that no background frame is available. The method of the invention comprises the following steps: raw data acquisition, non-uniformity fingerprint extraction and correction treatment, wherein the non-uniformity fingerprint refers to that each infrared focal plane detector has relatively stable non-uniformity modes and temperature-dependent rules which go under the general name of non-uniformity fingerprint. By pre-estimating the non-uniformity modes and rules, the method is capable of carrying out the non-uniformity correction on the actual infrared images acquired by the infrared focal plane detector. Compared with the conventional method for correcting the non-uniformity of the infrared focal plane, the invention can effectively reduce the size of the detection device and dispense with the background frame acquired by using a uniform baffle at each time of correction according to the conventional method, thereby greatly simplifying the correction process.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention belongs to the technical field of infrared imaging, and in particular relates to a correction method based on an infrared focal plane non-uniformity fingerprint mode. Background technique

[0002] With the development of infrared detectors, infrared imaging systems have also been developed. In the first-generation infrared imaging system, a linear detector is used to scan and image through a one-dimensional optical machine. In the mid-1970s, the appearance of the IRFPA (Infrared Focal Plane Array, infrared focal plane array) detector marked the birth of the second-generation infrared imaging system—the staring infrared imaging system. Compared with linear detectors, focal plane detector imaging has the advantages of high spatial resolution, strong detection capability, and high frame rate, and is rapidly becoming the mainstream device of infrared imaging technology. At present, the staring infrared imaging system has begun to be widely ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More