Internet of things test terminal based on OpenCPU scheme of LTE-Cat1 technology

Abstract

The invention discloses an Internet of Things test terminal based on an OpenCPU scheme of an LTE-Cat1 technology, which comprises an LTE-Cat1 communication module, a power supply module, an external sensor module, a peripheral interface module and a GPS positioning module, wherein an Internet of Things chip of an application layer processor integrated with a programmable framework is arranged in the LTE-Cat1 communication module; the external sensor module, the peripheral interface module and the GPS positioning module are all connected with the LTE-Cat1 communication module, and the power supply module supplies power to the LTE-Cat1 communication module, the external sensor module, the peripheral interface module and the GPS positioning module. An application function system of the Internet of Things test terminal is carried in an application layer processor, the application layer processor is used for secondary development of a drive program and an application program, completing service protocol data packing and communicating with a cloud platform server, and the Internet of Things test terminal is simple in hardware structure, high in integration degree, high in intelligent degree and high in safety.

Description

technical field [0001] The present invention relates to the technical field of Internet of Things test terminals, in particular to an Internet of Things test terminal based on the LTE-Cat1 technology OpenCPU solution. Background technique [0002] The development of the cellular Internet of Things is also largely influenced by the intergenerational upgrade of mobile communication networks, opening the way for intergenerational migration of connection methods. According to the data of Counterpoint, a market research organization, in the next few years, the number of cellular IoT connections will experience a transition from 2G+3G+4G to NB-IoT+4G. Therefore, the industry hopes that the old-generation network can accelerate frequency reduction and network withdrawal. , leaving scarce resources to the new generation network. [0003] Due to the long life cycle of IoT devices, users may consider not using 2G / 3G connection methods when making decisions under the risk of 2G / 3G net...

AI Technical Summary

Problems solved by technology

[0004] The present invention mainly solves the technical problems of complex hardware design, low security, low degree of integration, and low degree of intelligence of the original Internet of Things test terminal; it provides an Internet of Things test terminal based on the LTE-Cat1 technology OpenCPU solution, and integrates the Internet of Things The application function system of the test terminal is installed in the internal application layer processor of the IoT chip of the LTE-Cat1 module. The application layer processor can be used for the secondary development of the IoT test terminal driver and application program, and completes the business protocol data package , and communicate with the cloud platform server, the hardware structure is simple, the degree of integration is high, the degree of intelligence is high, and it has higher security

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