Method and device for clock detection

Abstract

This invention relates to one clock test method and device, which comprises the following steps: firstly generating meter energy signals according to local timing mechanism and the meter can transfer the tested signals into the clock zone to be tested to generate clock timer energy signals of zero and triggering the tested clock zone meter by signal and to start metering at fixed time circle; observing meter results to judge the accuracy of the clock to be tested.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a clock detection method and device. Background technique [0002] Clock detection technology is the most basic requirement in the field of electronic technology at present, and the purpose of clock detection is to ensure the normal operation of the electronic system. [0003] At present, the commonly used clock detection technology is mainly to detect the presence or absence of the clock under test. The usual method is as follows: First, drive the counter through the clock under test, divide the frequency of the clock, and then use the local standard clock to divide the frequency-divided signal Sampling, and then use the sampled periodic signal to synchronously clear the counter, and finally detect the value of the counter, so as to judge whether the clock under test is abnormal. [0004] In addition, there are still obvious deficiencies in the implementation methods of som...

AI Technical Summary

Problems solved by technology

[0007] From the current situation, there are two types of above-mentioned clock detection technologies provided by the prior art. One type only judges the presence or absence of the clock, but there is no specific detection method for the accuracy of the measured clock.

Another type of frequency detection method also has obvious defects. Therefore, it is impossible to accurately know the reliability of the service provided by the clock under test.

In this way, it is impossible to truly and accurately evaluate the performance and quality of the clock under test, and therefore it is impossible to solve the problems that may arise when the service provided by the clock under test is abnormal.

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