42 results about "Clock Test" patented technology

The invention relates to the technical field of testing of material complex permittivity, in particular to a method for measuring material complex permittivity based on substrate integrated waveguide round resonant cavities. The method comprises the steps that firstly, the substrate integrated waveguide round resonant cavities with different resonant frequencies (work frequencies) are machined; secondly, for the substrate integrated waveguide round resonant cavities with the same resonant frequency, a sample with material identical to that of a dielectric layer 2, a standard sample with the known complex permittivity and a sample to be measured are respectively loaded, swept-frequency signals are fed respectively through a vector network analyzer, and the resonant frequencies and the quality factors of the three samples are tested; finally, simultaneous equations are established and solved, and then the complex permittivity of the sample to be measured at the work frequency of the corresponding substrate integrated waveguide round resonant cavity can be obtained. A multi-frequency-point clock test of the material complex permittivity can be completed in the mode that the substrate integrated waveguide round resonant cavities with other work frequencies are used and the same test process is repeated. The method for measuring material complex permittivity based on the substrate integrated waveguide round resonant cavities has the advantages that the sizes of the substrate integrated waveguide round resonant cavities are small, machining is convenient, and the precision of a measurement result is high.

A clock test apparatus for a semiconductor integrated circuit includes a delay unit configured to delay an internal clock signal. A comparison unit compares the phase of an output signal of the delay unit with the phase of a reference clock signal. A phase discrimination unit receives a test mode signal, the reference clock signal, and an output signal of the comparison unit, thereby outputting a discrimination signal.

The invention discloses a test method based on a final circular test (FCT) multi-station test device. The test method based on the FCT multi-station test device comprises the following steps: establishing a supply voltage database, writing in an address for a printed circuit board assembly (PCBA) of an electric energy meter, writing in a relay return circuit test program for the PCBA of the electric energy meter, establishing a test database, establishing an impulse test database, establishing a clock test database, fixing the PCBA on a single-station test device, supplying power for the PCBA of the electric energy meter, detecting supply voltage, detecting 485 port, detecting a relay return circuit of the PCBA, detecting the impulse of the electric energy meter, detecting a clock of the electric energy meter, lowering the voltage, detecting battery a current of the PCBA of the electric energy meter, and fetching out the PCBA of the electric energy meter from the single-station test device. The test method based on the final circular test (FCT) multi-station test device has the advantages of being time-saving, labor-saving, high in test efficiency and high in precision of test results.

This invention provides an electron device clock testing method, which comprises the following steps: determining the said CPU interval terminal signals and inputting the tested clock signal into the interval end of the said CPU; triggering the said tested clock signals for testing according to the interval signal. The invention provides an electron clock test device, which comprises clock input module, triggering module and clock signal test module.

This invention relates to one clock test method and device, which comprises the following steps: firstly generating meter energy signals according to local timing mechanism and the meter can transfer the tested signals into the clock zone to be tested to generate clock timer energy signals of zero and triggering the tested clock zone meter by signal and to start metering at fixed time circle; observing meter results to judge the accuracy of the clock to be tested.

The invention discloses a time service receiver hardware delay calibration method and system based on clock correction compensation. The method is suitable for a time service receiver of which the observed value extraction time and the 1PPS are kept synchronous. Based on a signal processing process of the time service receiver, the invention provides a time service delay division method for emphasizing that satellite signals with different frequencies generate different hardware delays; on the basis, the invention further discloses a hardware delay measurement improvement scheme based on clockcorrection compensation; a common clock test system for a time service receiver and a satellite navigation signal simulator is built, a high-sampling-rate high-precision oscilloscope is used for measuring simulator delay of the satellite navigation simulator, a carrier phase smoothing pseudo-distance is used for distinguishing and receiving satellite signal frequency, clock difference is calculated, and therefore hardware delay calibration precision of the time service receiver is improved.

An apparatus and method perform static timing analysis on an integrated circuit design. Certain pessimistic assumptions regarding slack when data launch and clock test signals are on opposite edges and derived from common logic blocks are improved by creating a dummy clock edge that is on the same edge as the data launch signal, and allowing the timing tool to compute the slack improvement using its native functions. The slack improvement is then multiplied by a conversion factor, and the result is used to adjust the slack. The apparatus and method give credit for slack in common blocks automatically, thereby allowing a large number of pessimistic slack values to be automatically corrected and reducing the workload of an integrated circuit designer in addressing the timing problems in an integrated circuit design.

The invention relates to a high-precision time synchronization method and system applied to an electric energy meter. The high-precision time synchronization system includes a clock tester, a timing synchronization device and an electric energy meter. The time synchronization method comprises the following steps that: (1) the timing synchronization device reads system time T of the clock tester through a first communication interface; (2) the timing synchronization device writes the system time T to an electric energy meter to be subjected to time synchronization through a second communication interface; (3) the timing synchronization device reads system time T1 of the clock tester and system time T2 of the electric energy meter respectively through the first communication interface and the second communication interface; and (4) the difference value of T1 and T2 is obtained through comparison, if the difference value is smaller than a predetermined error threshold, time synchronization is successful, otherwise, the method returns to step (1). With the high-precision time synchronization method and system can ensure the reliability of the time of a terminal system to be subjected to time synchronization and ensure the accuracy of time synchronization.

The invention discloses a clock intelligent tester, and belongs to the technical field of clock test. The clock intelligent tester comprises a tester shell. Volume and power buttons are inserted in the left side wall of the tester shell. A display screen is embedded in the front wall of the tester shell. Mode control buttons and a parameter adjusting knob are transversely arranged in the middle part of the front wall of the tester shell. The mode control buttons and the parameter adjusting knob are arranged at the lower part of the display screen. The mode control buttons are arranged at the upper side of the parameter adjusting knob. Sound playing holes are transversely and uniformly arranged at the top part of the front wall of the tester shell. According to the clock intelligent tester, accurate time obtained by satellite positioning acts as reference time, the measurement accuracy can be fundamentally enhanced, the current value and the voltage value in the clock can be measured through mode adjustment, the test function of the tester can be enhanced, and the test personnel are enabled to accurately acquire measurement information through simultaneous display of image display and voice play.

The invention discloses a test system and method for adjusting a clock error of an intelligent electric meter. According to the test system for adjusting a clock error of an intelligent electric meter, a host computer is connected with a temperature detection module, a clock test module, a second pulse drive module, and a data processing and error display module through a communication module; thetemperature detection module is configured to detect ambient temperature of the intelligent electric meter; the second pulse drive module and the clock test module are configured to connect a secondpulse output by the intelligent electric meter to the clock test module when the ambient temperature of the intelligent electric meter is detected; the clock test module is connected to the data processing and error display module, and is configured to receive the pulse output by the second pulse drive module, test the clock error, and send the test result to the data processing and error displaymodule; and the data processing and error display module is configured to receive the test result of the clock error sent by the clock test module, and display the test result through the host computer.

The invention relates to the field of the mobile communication terminal, and discloses a slow clock test method for a mobile communication terminal and a test system of the slow clock test method. The slow clock test method comprises the following steps that in a period that USB (universal serial bus) connection between a test host and the mobile communication terminal is switched on, the test host is used for operating the mobile communication terminal through the USB connection according to a test case; after the USB connection between the test host and a mobile communication terminal to be tested is cut off, the test host is used for judging whether the mobile communication terminal to be tested enters a sleep mode or not; after the mobile communication terminal to be tested enters the sleep mode, a current value provided for the mobile communication terminal to be tested from a programmable constant current supply is obtained, and a slow clock test result of the mobile communication terminal is judged according to the obtained current value. Due to the fact that the current value provided for the mobile communication terminal to be tested from the programmable constant current supply is read in the test, current test precision can be improved. Due to the fact that the mobile communication terminal is operated by the test host via the USB connection, working efficiency is improved.

The invention discloses a clock test-and-control type balanced charging method of a lithium battery pack, wherein, a balanced charging circuit comprises the lithium battery pack, a plurality of module power supplies and a clock pulse generator, wherein, the lithium battery pack is composed of a plurality of single lithium batteries which are connected in series, an output end of each module power supply is correspondingly connected with the single lithium battery, and each module power supply is respectively equipped with an independent control switch; a pulse signal generated by the clock pulse generator controls connection and disconnection of the control switches of the plurality of the module power supplies; and each single lithium battery independently charges under control, and at the moment when the control switches of the module power supplies are disconnected and charging current is zero, the testing and controlling voltage of the corresponding single battery is sampled. The balanced charging method of the invention can eliminate influence of the charging loop resistance and the internal resistance of the battery, ensure voltage balance for each lithium battery during the charging process of the lithium battery pack and guarantee safety control against overcharge of each lithium battery pack.

The invention provides a digital circuit system test method. The method is characterized by carrying out test on collaborative modules in a digital circuit system in sequence through a power interface impedance test before powering up as well as a voltage correctness test, a phase-locked loop module clock test, a DDS accuracy and homologous stability test and an AD/DA access performance test after powering up, so that functions and performances of main modules in the digital circuit system can be subjected to comprehensive test, corresponding indexes of the digital circuit system can be evaluated effectively, test results can be obtained at a fastest speed, and reliability is high.

It is a chip with clock test function and its test method. The above chip at least comprises one first logic part, one-second logic part. The method comprises the following steps: to generate one third clock signal; to substitute the first clock signal with third clock signal; to test the above the part outside the first clock generation device of the chip; to make the first logic operation independent to the second logic part to test the first clock generation device.