Clock signal detection method and apparatus in electronic devices

Abstract

This invention provides an electron device clock testing method, which comprises the following steps: determining the said CPU interval terminal signals and inputting the tested clock signal into the interval end of the said CPU; triggering the said tested clock signals for testing according to the interval signal. The invention provides an electron clock test device, which comprises clock input module, triggering module and clock signal test module.

Description

technical field [0001] The invention relates to the technical field of network communication, in particular to a clock signal detection method and device in electronic equipment. Background technique [0002] The clock is the basis for communication among various communication devices in the communication system. If the quality of the clock signal is poor or the clock signal is lost, digital information will be confused during the transmission process, and even the entire communication device will be in a state of paralysis. Therefore, it is very important in the communication system to ensure the reliability of the clock signal of the communication equipment and to detect the clock signal of the clock signal. [0003] At present, the method for detecting the clock signal is mainly: add a clock source to the circuit of the communication equipment, generate a clock signal from the clock source, and then use the method of frequency division to change the frequency of the clock...

AI Technical Summary

Problems solved by technology

When the detected clock frequency is low to a certain extent, even the detection of the clock signal cannot be realized

[0005] In addition, the design of the clock signal detection circuit using the clock vibration source method is relatively complicated and the cost is relatively high. Moreover, once the clock signal detection circuit is designed, it can only detect a clock signal of one frequency. It can only be realized by changing the design of the detection circuit, and the versatility of the detection circuit is poor

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