Digital circuit system test method

A digital circuit and test method technology, applied in the field of testing, can solve the problems of digital circuit system damage, affecting complexity, etc., and achieve the effect of high reliability

Active Publication Date: 2017-03-22
SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

During the test process, the order of the test steps will directly affect the complexity of the test results obtained by the

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Embodiment Construction

[0052] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0053] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0054] The test method of the digital circuit system of the present embodiment, wherein the digital circuit system comprises: AD (analog-to-digital conversion) module, FPGA (Field Programmable Gate Array, Field Programmable Gate Array) module, DA (digital-to-analog conversion) module...

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Abstract

The invention provides a digital circuit system test method. The method is characterized by carrying out test on collaborative modules in a digital circuit system in sequence through a power interface impedance test before powering up as well as a voltage correctness test, a phase-locked loop module clock test, a DDS accuracy and homologous stability test and an AD/DA access performance test after powering up, so that functions and performances of main modules in the digital circuit system can be subjected to comprehensive test, corresponding indexes of the digital circuit system can be evaluated effectively, test results can be obtained at a fastest speed, and reliability is high.

Description

technical field [0001] The invention relates to the testing field, in particular to a testing method for a digital circuit system. Background technique [0002] With the rapid development and application of electronic information technology and ultra-large-scale integrated circuits, the field and scope of digital signal processing technology applications are also expanding. Compared with analog signal processing, digital signal processing has the advantages of good flexibility, high precision and stability, convenient development and strong functions. A digital circuit system typically includes many modules that work together. After the digital circuit system completes the principle design, printed board production and welding assembly, it needs to be tested to ensure the correctness and reliability of the system. When the components of the digital circuit system board burn out or the circuit is damaged, it may be necessary to pass the test. repair. During the test proces...

Claims

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Application Information

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IPC IPC(8): G01R31/3181
CPCG01R31/3181
Inventor 刘杰帅涛赵广东陈鹏飞张喆黄奕
Owner SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM
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