Digital circuit system test method
A digital circuit and test method technology, applied in the field of testing, can solve the problems of digital circuit system damage, affecting complexity, etc., and achieve the effect of high reliability
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[0052] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0053] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.
[0054] The test method of the digital circuit system of the present embodiment, wherein the digital circuit system comprises: AD (analog-to-digital conversion) module, FPGA (Field Programmable Gate Array, Field Programmable Gate Array) module, DA (digital-to-analog conversion) module...
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