Method for measuring material complex permittivity based on substrate integrated waveguide round resonant cavities
A substrate-integrated waveguide and complex permittivity technology, applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as inaccurate measurement, large radiation loss, and low quality factor
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[0043] A method for measuring the complex permittivity of a material based on a substrate-integrated waveguide circular resonator, comprising the following steps:
[0044] Step 1: Process substrate-integrated waveguide circular resonators with different resonant frequencies. The structure of the substrate integrated waveguide circular resonant cavity is as follows figure 1 , 2 As shown, it is processed from a dielectric plate covered with metal conductive layers on both sides, including an upper metal conductive layer 1, a dielectric layer 2, and a lower metal conductive layer 3. The dielectric layer 2 is located between the upper metal conductive layer 1 and the lower metal conductive layer. Between the conductive metal layers 3 , several metallized through holes 4 uniformly distributed in a circular shape connect the upper conductive metal layer 1 and the lower conductive metal layer 3 together. The working mode of the substrate-integrated waveguide circular resonator adop...
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