Method of displaying measurement result in inspection process and system thereof, and computer program
a technology of measurement result and inspection process, applied in the direction of mechanical roughness/irregularity measurement, semiconductor/solid-state device testing/measurement, instruments, etc., can solve the problems of inability to immediately perform measurement validation, inspectors may be away from other measuring devices, and the prior ar
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Benefits of technology
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0036]An embodiment of the invention is explained in detail below with reference to drawings. FIG. 1 illustrates a schematic structure of a system of displaying a measurement result in an inspection process according to this embodiment.
[0037]As shown in FIG. 1, the system of displaying a measurement result in the inspection process according to this embodiment includes a host (host server) “A” including a process management server 10 and a device control server 20, a host terminal 30 and a device (measuring device) 40 including a signal tower (four (4)-lamp light and four color display unit) 40T. The device (main unit of the device) 40 measures each lot (carrier) 50.
[0038]The host “A” stores a host management table including a machine type of the device 40, step numbers, items for inspection (the thickness and the width, for example) and subjects of inspection (the film thickness and the line width, for example); a process flow (a flow sheet); and a lot progress / processing log. More...
PUM
| Property | Measurement | Unit |
|---|---|---|
| colors | aaaaa | aaaaa |
| electrical characteristics | aaaaa | aaaaa |
| thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 


