X-ray measuring instrument

A measuring device, X-ray technology, applied in the direction of radiological diagnostic instruments, medical science, diagnosis, etc., can solve the problem that the three-dimensional image cannot express the correct value, and achieve the effect of eliminating the saturation phenomenon
CN100579453CInactive Publication Date: 2010-01-13HITACHI MEDICAL CORP
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
HITACHI MEDICAL CORP
Publication Date
2010-01-13
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

An X-ray measuring instrument in which an object under examination is irradiated with X-rays, measurement data on the object is detected, a filter for adjusting the amount of transmitted X-rays is disposed between an X-ray source and the object, the relative position of the X-ray source to the object is varied, and the acquired measurement data is computed. The measurement data is subjected to logarithm transform to acquire projection data, and the amount of absorbed X-rays of the filter corresponding to the acquired projection data is determined. The thickness of the filter is computed by using a predetermined transform formula for the acquired amount of absorbed X-rays. A correction coefficient corresponding to the projection data acquired from the computed thickness of the filter is determined, and the projection data is multiplied by the determined correction coefficient. The projection data multiplied by the correction coefficient is restructure-computed to obtain a three-dimensional image.
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Description

technical field

[0001] The present invention relates to an X-ray measuring device capable of suppressing detector saturation and obtaining a good three-dimensional image with improved value uniformity. Background technique

[0002] An X-ray measuring device has an X-ray source and a two-dimensional X-ray detector disposed on both open ends of a C-shaped support (hereinafter referred to as a C arm). There is a structure for hanging the C-arm from the ceiling or a structure for supporting the C-arm on the ground. In addition, there is an X-ray measuring device in which an X-ray source is opposed to a two-dimensional X-ray detector and arranged on a barrel frame. In these devices, by rotating the C-arm or the barrel frame, the X-ray and detector pairs can be rotated around the subject, and X-ray detection can be performed simultaneously. In addition, correction processing is performed on multiple measurement data obtained by rotation measurement, so as to obtain a set of proj...

Claims

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