Provided is a highly reliable
semiconductor device capable of multiplication. This
semiconductor device comprises first and second cells and a drive circuit. Each of the first
cell and the second
cell includes first to third transistors and a resistance change element. The drive circuit includes a first input terminal, a second input terminal, and an output terminal. The resistance change element includes a conductive layer and an MTJ element. The conductive layer includes a first region connected to one of the source and the drain of the first
transistor, a second region connected to one of the source and the drain of the second
transistor, and a region in contact with a free layer of the MTJ element located between the first region and the second region. A fixed layer of the MTJ element includes a third region connected to one of the source and the drain of the third
transistor. The drive circuit has a function of outputting to the output terminal, as a
signal, information corresponding to a difference between a current flowing between the first
cell and the first input terminal and a current flowing between the second cell and the second input terminal.