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270 results about "Analog multiplier" patented technology

In electronics, an analog multiplier is a device which takes two analog signals and produces an output which is their product. Such circuits can be used to implement related functions such as squares (apply same signal to both inputs), and square roots.

High efficiency linearization power amplifier for wireless communication

An embodiment of the invention uses a predistortion correction signal to combination the modulated RF signal by an analog multiplier for linearization of power amplifiers having nonlinear characteristics such as those used in wireless RF transmitters. A predistortion controller comprises a plurality of down converters for retrieving both the ideal non-distorted information and the feedback distorted information, together with pre-stored digitally-indexed predistortion information stored, for example, in a look-up table. The digitally-indexed information models nonlinear characteristics of the high power amplifier, and is stored prior to processing of pre-compensation in the power amplifier. When the predistortion information is combined with the modulated RF signal in the analog multiplier, the result is a substantially linear information transmission from the power amplifier. In an embodiment of the system, the modulated RF input signal and the feedback signal from PA output are down-converted, respectively, by analog devices, such as mixers, after which the analog intermediate frequency (IF) signals are digitized by analog-to-digital converters for digital predistortion correction processing, followed by predistortion processing performed by, for example, a DSP or FPGA chip to generate a digital correction control signal, which is then converted to an analog signal by a digital-to-analog converter, followed by combining the analog correction signal with the RF modulated input signal to yield the input to the power amplifier.
Owner:DALI WIRELESS

Method of manufacturing a sensor detecting a physical action as an applied force

A sensor comprises a semiconductor pellet (10) including a working portion (11) adapted to undergo action of a force, a fixed portion (13) fixed on the sensor body, and a flexible portion (13) having flexibility formed therebetween, a working body (20) for transmitting an exterted force to the working portion, and detector means (60-63) for transforming a mechanical deformation produced in the semiconductor pellet to an electric signal to thereby detect a force exerted on the working body as an electric signal. A signal processing circuit is applied to the sensor. This circuit uses analog multipliers (101-109) and analog adders / subtracters (111-113), and has a function to cancel interference produced in different directions. Within the sensor, two portions (E3, E4-E8) located at positions opposite to each other and producing a displacement therebetween by action of a force are determined. By exerting a coulomb force between both the portions, the test of the sensor is carried out. Further, a pedestal (21, 22) is provided around the working body (20). The working body and the pedestal are located with a predetermined gap or spacing therebetween. A displacement of the working body is caused to limitatively fall within a predetermined range corresponding to the spacing. The working body and the pedestal are provided by cutting a same common substrate (350, 350')
Owner:OKADA KAZUHIRO

Apparatus for detecting a physical quantity acting as an external force and method for testing and manufacturing this apparatus

A sensor comprises a semiconductor pellet (10) including a working portion (11) adapted to undergo action of a force, a fixed portion (13) fixed on the sensor body, and a flexible portion (13) having flexibility formed therebetween, a working body (20) for transmitting an exterted force to the working portion, and detector means (60-63) for transforming a mechanical deformation produced in the semiconductor pellet to an electric signal to thereby detect a force exerted on the working body as an electric signal. A signal processing circuit is applied to the sensor. This circuit uses analog multipliers (101-109) and analog adders / subtracters (111-113), and has a function to cancel interference produced in different directions. Within the sensor, two portions (E3, E4-E8) located at positions opposite to each other and producing a displacement therebetween by action of a force are determined. By exerting a coulomb force between both the portions, the test of the sensor is carried out. Further, a pedestal (21, 22) is provided around the working body (20). The working body and the pedestal are located with a predetermined gap or spacing therebetween. A displacement of the working body is caused to limitatively fall within a predetermined range corresponding to the spacing. The working body and the pedestal are provided by cutting a same common substrate (350, 350′).
Owner:WAKO CO LTD

Method of testing a sensor

A sensor comprises a semiconductor pellet (10) including a working portion (11) adapted to undergo action of a force, a fixed portion (13) fixed on the sensor body, and a flexible portion (13) having flexibility formed therebetween, a working body (20) for transmitting an exterted force to the working portion, and detector means (60-63) for transforming a mechanical deformation produced in the semiconductor pellet to an electric signal to thereby detect a force exerted on the working body as an electric signal. A signal processing circuit is applied to the sensor. This circuit uses analog multipliers (101-109) and analog adders / subtracters (111-113), and has a function to cancel interference produced in different directions. Within the sensor, two portions (E3, E4-E8) located at positions opposite to each other and producing a displacement therebetween by action of a force are determined. By exerting a coulomb force between both the portions, the test of the sensor is carried out. Further, a pedestal (21, 22) is provided around the working body (20). The working body and the pedestal are located with a predetermined gap or spacing therebetween. A displacement of the working body is caused to limitatively fall within a predetermined range corresponding to the spacing. The working body and the pedestal are provided by cutting a same common substrate (350, 350).
Owner:WAKO CO LTD

Electrostatic interference preventing capacitance measuring circuit and method

The invention discloses electrostatic interference preventing capacitance measuring circuit and method. The measuring circuit comprises a first signal generator, a second signal generator, a capacitance and voltage conversion module, a band-pass filter, a signal amplifier, an analog multiplier and a low-pass filter; the capacitance and voltage conversion module comprises a capacitance sensor, and a converting module for converting the capacitance detected by the capacitance sensor into voltage; the first signal generator is connected with an exciting electrode of the capacitance sensor; the band-pass filter, the signal amplifier, the analog multiplier and the low-pass filter are sequentially connected in series with the output end of the conversion module; the second signal generator is connected to another signal input port of the analog multiplier; an output signal of the second signal generator has the same frequency with the output siganl of the first signal generator, and the phase difference of the two output signals is zero. Compared with the prior art, the circuit has the advantages that the problem of particle charge interference during charge injection, zero drifting and air and solid flowing as the measuring objects can be overcome, and therefore, measurement deviation can be avoided.
Owner:SOUTHEAST UNIV

Multi-channel sinusoidal signal generator and method for generating multi-channel sinusoidal signals

The invention discloses a multi-channel sinusoidal signal generator and a method for generating multi-channel sinusoidal signals. By the adoption of the multi-channel sinusoidal signal generator and the method for generating the multi-channel sinusoidal signals, the sinusoidal signals of tens of or hundreds of channels can be directly generated, and the amplitude, the frequency, and the initial phase of each signal can be digitally set; synchronization of the signals of all channels or signals of a plurality of channels can be achieved, and phase difference can be set between every two same-frequency signals. A waveform generation circuit is composed of a single programmable logic device and multiple analog units. Each analog unit is controlled by an amplitude control signal, a phase frequency control signal and a public fundamental frequency square signal. At least 2N+1 control lines, for driving the N channel analog units, of the programmable logic device are arranged. According to the multi-channel sinusoidal signal generator, a storage, a DAC and an analog multiplier are not applied to the waveform generation circuit, and only one programmable logic device, N analog multi-channel switches, N four-operational-amplifiers and N dual-operation-amplifiers are adopted, so that the hardware cost is low, and an analog circuit is simple. The multi-channel sinusoidal signal generator and the method for generating the multi-channel sinusoidal signals are suitable for application occasions requiring one or more characteristics such as a large number of channels, channel synchronization, and channel isolation.
Owner:HARBIN UNIV OF SCI & TECH

Lock-in amplifier of analog-digital mixed structure and lock-in amplification method of lock-in amplifier

The invention discloses a lock-in amplifier of an analog-digital mixed structure and a lock-in amplification method of the lock-in amplifier. The lock-in amplifier comprises an input signal processing system, a reference signal generation system, an analog processing system, an analog-to-digital conversion system and a digital processing system, wherein the first output end and the second output end of the reference signal generation system output two paths of sine wave reference signals which are mutually orthogonal; the analog processing system comprises two analog multipliers and an analog low-pass filter; the digital processing system comprises two digital low-pass filters and a digital operational unit. According to the lock-in amplifier, an aliasing signal is allowed to exist in a signal detection process; through the combination of the analog low-pass filter and the digital low-pass filters, an interference signal in an input signal can be effectively filtered, and a high-frequency interference signal and the aliasing signal are filtered, so that various frequency signals can be detected, the signal to noise ratio is effectively improved, hardware requirements are reduced, and the production cost is lower; the lock-in amplifier can be widely applied to the field of weak signal measurement.
Owner:SYSU CMU SHUNDE INT JOINT RES INST +1
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