Pipeline analog-to-digital converter and quick calibration method of capacitance mismatch thereof

A technology of analog-to-digital converters and analog-to-digital conversions, applied in the direction of analog-to-digital converters, analog/digital conversion calibration/testing, etc., can solve the problems of extended calibration time, long calibration time, etc., to improve linearity and reduce calibration costs Time, the effect of increasing the effective number of digits

Active Publication Date: 2010-07-14
上海迦美信芯通讯技术有限公司
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Problems solved by technology

However, the calibration time of this calibration method is long, and as the eff...

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  • Pipeline analog-to-digital converter and quick calibration method of capacitance mismatch thereof
  • Pipeline analog-to-digital converter and quick calibration method of capacitance mismatch thereof
  • Pipeline analog-to-digital converter and quick calibration method of capacitance mismatch thereof

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Embodiment Construction

[0064] The specific embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0065] See Figure 9 As shown, a pipelined analog-to-digital converter and a fast calibration method for capacitance mismatch provided by the present invention relate to a pipelined analog-to-digital converter, which uses a sample-and-hold module to sample an input analog signal, and several stages of circuit modules connected in series 20 and the post-analog-to-digital conversion module 30 perform quantization of the analog-to-digital conversion, and the quantization results of each level are weighted and added by the digital displacement addition module 40 , and output digital signals through the redundancy processing module 50 . The pipelined analog-to-digital converter improves several stages of circuit modules 20 provided in the existing pipelined analog-to-digital converter.

[0066] See Image 6 As shown, each stage circuit module 20 in the...

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Abstract

The invention relates to a pipeline analog-to-digital converter and a quick calibration method of capacitance mismatch thereof. The quick calibration method is characterized by carrying out inverted order calibration from a level circuit module of the last level. The calibration method of the level circuit module of each level comprises the following steps of: 1. starting calibration: closing thesecond transfer switch and the fourth transfer switch and cutting off the first transfer switch and the third transfer switch to enable the level circuit modules to work in the calibration state; 2. measuring quantitative results: setting input signals for the level circuit modules, and carrying out analog-to-digital conversion by the level circuit modules following the corresponding level and the back analog-to-digital conversion module of the pipeline analog-to-digital converter to obtain a set of corresponding quantitative results; and 3. measuring quantitative step length: subtracting thecorresponding quantitative results to obtain the actual quantitative step length of the level circuit modules and storing the step length in a storage module. Roughly quantitative calibration resultsare added by the invention, thereby improving the linearity of the transmission function of the pipeline analog-to-digital converter and increasing the significant digit of analog-to-digital conversion.

Description

technical field [0001] The invention relates to an analog-to-digital converter and a calibration method thereof, in particular to a pipelined analog-to-digital converter and a fast calibration method for capacitance mismatch thereof. Background technique [0002] See figure 1 As shown, the existing pipelined analog-to-digital converter samples the input analog signal through the provided sample-and-hold module 100, and performs quantization of the analog-to-digital conversion by several stages of circuit modules 200 in series and the post-analog-to-digital conversion module 300, and each obtained The quantization results of the stages are weighted and added through the digital offset and addition module 400 to output digital signals. [0003] See figure 2 As shown, each stage circuit module 200 is controlled by a two-phase non-overlapping clock. In phase 1, the stage circuit sampling module 230 samples the analog signal input to the stage, and the analog-to-digital conve...

Claims

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Application Information

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IPC IPC(8): H03M1/14H03M1/10
Inventor 倪文海王睿
Owner 上海迦美信芯通讯技术有限公司
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