Analyzing system of technical level of patent applicant

A technology of technical level and analysis system, applied in the field of technical level analysis system of patent applicants, can solve the problems of complex and disordered, unable to visually display the technical level of applicants, lack of in-depth processing and mining of data, etc., and achieve intuitive and easy analysis results. understand the effect

Inactive Publication Date: 2011-03-30
J Z M C INTPROP DATA SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These are just some of the most primitive data, complex and disorderly, unable to intuitively show the technical level of the applicant, often people still don't know why after reading it
At the same time, due to the lack of in-depth processing and mining of these data, it is impossible to use these data to display more information

Method used

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  • Analyzing system of technical level of patent applicant
  • Analyzing system of technical level of patent applicant
  • Analyzing system of technical level of patent applicant

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0020] See figure 1 , figure 1 It is a structural block diagram of the display system disclosed by the present invention. As shown in the figure, a patent applicant technical level analysis system includes an applicant information extraction module, a technical information statistics module, a technical level calculation module and a technical level display module.

[0021] The applicant information extraction module extracts the corresponding applicant information from the technical subject patent literature database, and the technical information statistical module counts relevant information and stores it in the technical information statistical table unit.

[0022] The technical level calculation module reads the information in the technical information statistical table unit and performs calculations accordingly. figure 2 A schematic diagram showing the structure of the technical level calculation module. As shown in the figure, the technical level calculation module ...

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PUM

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Abstract

The invention relates to an analyzing system of a technical level of a patent applicant, which comprises an applicant information extracting module, a technical information counting module, a technical level computing module and a technical level display module, wherein the technical information counting module comprises a technical information statistic table unit for counting each item of information obtained by the applicant information extracting module; the technical level computing module at least comprises a technology independence computing unit, a research and development capability computing unit, an emphasis technology analyzing unit and a technology potential computing unit and is used for reading the contents of the technical information counting module and computing each value of the technical level of the applicant according to a statistic result of the technical information counting module; and the technical level display module is used for displaying the technical level of the applicant according to the contents of the technical information counting module and the technical level computing module. The system has the advantages of discovering related information of the applicant deeply, comprehensively and thoroughly analyzing the technical level of the applicant, and simultaneously displaying the result in a more visual and easier mode.

Description

technical field [0001] The invention relates to a patent analysis system, in particular to a patent applicant's technical level analysis system. Background technique [0002] The analysis of the applicant's patent technical level is an important content in the patent analysis system, and it is also the focus of many companies' patent analysis. The analysis of the technical level of the applicant plays a vital role in in-depth understanding of the technological development trend, technological investment, technological research and development level, and key technological conditions of major competitors in the industry. [0003] The usual patent analysis work is generally just to list some information of the applicant, such as the number of patents of the applicant, the number of citations of the applicant's patents, the number of patent families, etc. These are just some of the most primitive data, which are complex and disorderly, and cannot intuitively show the technical ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
Inventor 唐向东魏国柱
Owner J Z M C INTPROP DATA SCI & TECH
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