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A test method for switch configuration

A test method and switch technology, applied in the direction of data exchange network, digital transmission system, electrical components, etc., can solve the problems of multiple test resources, long test time, affecting the reliability of results, etc., achieve accurate test results, reduce the number of restarts, The effect of shortening the test cycle

Active Publication Date: 2017-12-05
湖州帷幄知识产权运营有限公司
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] 3. Long test cycle: The current switch has many functions. Testing according to the existing method will inevitably extend the test cycle. Assuming that the switch has more than 1,000 function items, it generally takes about 200 hours for one person to test all functions.
Cause developers to be unable to fix bugs in time
[0009] 4. Increase the R&D cost of the product: the long test time and the occupation of more test resources directly lead to the increase of product cost
[0010] 5. The reliability is not high: due to the defect of the test method, it may cause missed test, which affects the reliability of the result

Method used

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  • A test method for switch configuration
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Embodiment Construction

[0046] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0047] figure 1Schematic running for a user profile. Wherein, when the test engineer configures the switch through the console port of the switch, the configuration information of the switch at this time will be temporarily stored in the current configuration file in the RAM. Save the configuration of the switch. During the configuration saving process, a process will be automatically established inside the switch. This process is responsible for saving the current switch configuration information to the startup configuration file (startup-config) in the switch storage component. In this way, when the switch system is powered off and restarted, it will load the startup configuration file saved in the switch storage unit, and transfer the file to RAM to execute one by one to perform related syst...

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Abstract

The invention discloses a test method for switch configuration, which belongs to a test method for switches, comprising: S1. switch console presets a switch command set file; S2. reads the command set file sent by the switch console; S3. Check the user configuration information under the current switch configuration through the switch viewing module in the first environment of the switch; S4. Check the running status information of the switch in the second environment of the switch through the viewing module; S5. Save the current user configuration information to the switch storage Among the components; S6. The switch is powered off and restarted multiple times; S7. Viewing the user configuration information under the current switch configuration in the first environment of the switch through the switch viewing module. The beneficial effect of the invention is that it has the advantages of comprehensive testing, reducing switch restart times, shortening test cycle, reducing research and development costs, and improving test reliability.

Description

technical field [0001] The invention relates to a test method for switches, in particular to a test method for switch configurations. Background technique [0002] With the acceleration of social informatization, the application of the network has penetrated into all aspects of society and has become an indispensable tool in work and life. The switch is the core device in the network and communication, and the data forwarding and delivery in the network cannot be separated from the participation of the switch. The switch realizes the encapsulation and forwarding of data packets based on the two-layer mac address identification. Its hardware mainly includes the central processing unit (CPU), switching chip (MAC), memory, registers, console port, interface and auxiliary port, and the memory includes read-only memory (ROM), flash memory (Flash), non-volatile Random Access Memory (NVRAM) and Random Access Memory (RAM), etc. The non-volatile random access memory stores user co...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26
Inventor 黎锋娟吴旭顾知伟
Owner 湖州帷幄知识产权运营有限公司
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