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344 results about "Testing reliability" patented technology

A testing reliability is a set of two probabilities, the definition of which varies by field. In medicine, the sensitivity and specificity are conventionally used. In the field of defect detection testing, the probabilities of detection and false call are conventionally used.

Multi-ring-arranged double-integrated circuit (IC) chip packaging piece and production method thereof

The invention discloses a multi-ring-arranged double-integrated circuit (IC) chip packaging piece and a production method thereof. The multi-ring-arranged double-IC chip packaging piece comprises a multi-ring quad flat no (QFN) lead frame with a carrier, an internal pin, IC chips and a plastic package body. The production method comprises the following steps of: thinning; scribing; adding the chips primarily; performing pressure welding; inversely adding the chips secondarily; filling the bottom and solidifying; performing plastic packaging and post solidifying; printing; separating pins; electroplating; separating products; testing the products; packing; and warehousing. Compared with a single-row lead frame with the same area as the multi-ring QFN lead frame, the multi-ring QFN lead frame increases the pins by over 40 percent, so that the requirements of high density and multiple input/output (I/O) packages are met; the chips are inversely added, so that the packaging piece has a small number of short welding lines, a short heat conduction distance and high radiation capacity; through the inverse addition of the chips, the capacitance and the inductance between protruding points and the pins are far lower than those of the welding lines between a chip welding disc and the pins, so that the influence on high frequency application is reduced; and the thickness of a QFN can be reduced to be below 0.5mm, so that the intersection and the open circuit of the welding lines are avoided and testing qualified rate and testing reliability are improved.
Owner:TIANSHUI HUATIAN TECH +1

Horizontal hole ground stress measurement device based on BWSRM (Borehole Wall Stress Relief Method) principle

The invention relates to a horizontal hole ground stress measurement device based on a BWSRM (Borehole Wall Stress Relief Method) principle, which is used for the technical field of measurement of stress of rocks in an underground cavity or a mine opening. The horizontal hole ground stress measurement device comprises a sealed cable joint, a stress measurement main working part, a multiway stress measuring instrument, a measurement control unit and a detection part, wherein the sealed cable joint is connected with the front end of the stress measurement main working part to be used as an output port for a power cable and a communication cable of the integral device; the stress measurement main working part is sequentially connected with the multiway stress measuring instrument, the measurement control unit and the detection part; the multiway stress measuring instrument is used for recording variation of stress on a working surface in the process that a thin-walled diamond core drill implements ring-shaped cutting on surrounding rocks of the hole wall of a borehole; and the detection part is used for observing and recording the quality condition of the hole wall of the borehole in the process of propelling integral equipment into the horizontal borehole to a working hole depth and providing reference basis for a local hole section which is selected to be subjected to stress relief. According to the invention, the integral measuring process is controlled sufficiently by an electromechanical integration technology through adopting a main control module; and test reliability and measurement accuracy can be greatly improved. The horizontal hole ground stress measurement device is convenient to carry and apply in the field and easy to operate in the field and can carry out three-dimensional ground stress actual measurement easily.
Owner:SHANGHAI JIAO TONG UNIV

Method for testing reliability of semiconductor devices

InactiveCN102073004AIncrease usageDegradation of electrical characteristicsIndividual semiconductor device testingGate dielectricLayer thickness
The invention discloses a method for testing reliability of semiconductor devices which have negative bias temperature instability (NBTI). The method comprises the following steps: measuring the NBTI curve of a first set of semiconductor devices; measuring the 1 / f noise power spectral density and drain current of the first set of semiconductor devices at a predetermined frequency under the condition that the first set of semiconductor devices is biased in a gate electric field; measuring the equivalent oxide layer thickness of the gate dielectric of the first set of semiconductor devices; measuring the 1 / f noise power spectral density and drain current of a second set of semiconductor devices at the predetermined frequency under the condition that the second set of semiconductor devices is biased in the gate electric field; measuring the equivalent oxide layer thickness of the gate dielectric of the second set of semiconductor devices; and evaluating the deterioration characteristic of the second set of semiconductor devices by using the NBTI curve of the first set of semiconductor devices. The method disclosed by the invention saves the time required for testing the reliability of a large number of semiconductor devices, and can not damage the second set of semiconductor devices.
Owner:PEKING UNIV

Grain cleaning loss detection method for combined harvester and device thereof

The invention discloses a grain cleaning loss detection method for a combined harvester and a device thereof. An array type piezoeletric quartz sensor is installed at the outlet of a cleaning sieve, the signal output from the array type piezoeletric quartz sensor is transmitted into a charge amplifier and a gain adjustable circuit to be processed and converted into a voltage signal with a certain amplitude value; a high pass filtering circuit and a sensitivity regulating circuit are used to respectively separate out the features of the vibration noise and the grain signals from the frequency domain and the time domain; the separated vibration noise and grain signals are rectified into standard pulse signals which can be executed by a micro monolithic processor through a pulse shaping circuit; the grain cleaning loss is detected by the method of full-width distribution of multi-lamella piezoelectric detection array, information is acquired from multiple areas and multiple angles, thereby enhancing the grain impact signals, improving the grain-grass identification precision and improving the testing reliability of the system; the detecting device has the advantages of good integral dynamic performance, strong anti-jamming capability, and high measurement precision, thereby realizing online measurement of the cleaning loss in the field.
Owner:JIANGSU UNIV

Light aging testing method for composite core rod

The invention discloses a light aging testing method for a composite core rod, which is characterized in that the method comprises the following steps of: 1) cutting off a test sample; 2) fixing the test sample; 3) increasing the temperature of a box body; 4) conducting a light aging test; 5) conducting a simulated rainfall test; 6) conducting a condensation test; 7) conducting a circulating test; 8) conducting visual inspection; and 9) conducting a tensile strength test. According to the working state and the performance demands of the composite core rod, not only can the alternate change of sunshine and dark environments in a natural environment, the alternate change of high-temperature and low-temperature humid and hot environments, dew condensation at dark nights and the like be designed, but also the test sample is turned round at even speed and the aging behavior of the composite core rod in the natural environment is highly simulated. After the light aging test, the tensile strength of the composite core rod is tested to fully assess the mechanical property change of the test sample before and after the light aging test. Therefore, the light aging testing method for the composite core rod has the advantages of high simulation level, complete performance assessment, high testing reliability and the like.
Owner:ZHEJIANG HUADIAN EQUIP TESTING INST

Device and method for testing reliability of chain-type tool magazine and manipulator

The invention discloses a device for testing the reliability of a chain-type tool magazine and a manipulator. The device comprises a base, the chain-type tool magazine, a tool, a hydraulic driving mechanism, the manipulator, a main shaft, a fixed frame, a test bed, a first displacement sensor, a triaxial acceleration sensor, a uniaxial acceleration sensor, a photoelectric proximity switch, a second displacement sensor, a first supporting frame, a second supporting frame and a third supporting frame, wherein the base is fixed on the ground; the chain-type tool magazine is fixedly arranged on the base; the tool is arranged at a tool position of the chain-type tool magazine, and is rotated by the chain-type tool magazine to reach a tool change position; the hydraulic driving mechanism is fixedly connected with the chain-type tool magazine; and the manipulator is arranged on the output shaft of the hydraulic driving mechanism, and is driven by the hydraulic driving mechanism to rotate, transversely translate and longitudinally translate so as to realize actions of tool catching, tool extraction, tool change and tool assemble. The device can test the reliability of the chain-type tool magazine and the manipulator, and has the advantages of convenience in operation and high practicability.
Owner:NANJING UNIV OF SCI & TECH

Recording and playback test method and related device

The invention discloses a recording and playback test method and a related device. The method includes the steps of determining a target control matched with triggered control on operation interface during recording from operation interface during playback based on semantic information of control on operation interface of tested software during recording and playback; during recording, correspondingly applying the operation applied to triggered control to target control during playback, so that playback of operation corresponding to operation interface during recording is realized; and recording each operation in the obtained operation sequence, determining the target control one by one according to the execution sequence of each operation in the operation sequence, and executing the corresponding operation, so that the playback of the whole operation sequence can be completed, and finally, the test result of the tested software is determined. According to the method, the control is matched according to the semantic information of the control, operation playback is carried out depending on the coordinate position on the operation screenshot, the playback failure probability is effectively reduced, and the test reliability is improved. And furthermore, a more accurate test result of the tested software can be obtained.
Owner:度小满科技(北京)有限公司

Parallel test board used in testing semiconductor memory devices

A parallel test board preferably includes a plurality of serial slots connected to a motherboard and a number of parallel slots connected to the motherboard in parallel with each other. The motherboard provides an actual operational environment for devices under test (DUTs). DUTs are mounted in the slots. Using a plurality of serial slots, distorted timings due to one serial slot (e.g., an extension slot) have an influence on the other serial slot (e.g., a reference slot), as well as on the parallel slots. In this manner, a timing margin failure occurring during a multi-bank operation can be effectively detected. The slots to which the DUTs are mounted preferably have a socket structure with a support block having contact pins arranged thereon. Each of the contact pins preferably has a module contact part configured to contact a tab of the DUT and a board contact part configured to contact conductive wiring patterns of an intermediation board. An elastic member is also preferably interposed between the support block and each of the module and the board contact parts. According to various aspects and embodiments of this invention, testing reliability is improved and the durability of the test board is significantly increased.
Owner:SAMSUNG ELECTRONICS CO LTD

Automatic test system and method for transformer substation measurement and control device

The invention provides an automatic test system and method for a transformer substation measurement and control device. The system comprises a test background server, an exchanger, a network tester, an intelligent tester, a three-phase standard meter, a controllable power source and a GPS clock module. The data exchanging is respectively carried out between the network tester and the test background server, between the intelligent tester and the test background server, between the three-phase standard meter and the test background server and between the controllable power source and the test background server through the exchanger, the test background server is in communication with the measurement and control device through the network protocol, the controllable power source is controlled to supply electricity to the measurement and control device, and time synchronism between the test background server and the measurement and control device is achieved through a GPS clock module. According to the automatic test system and method for the transformer substation measurement and control device, a test task can be automatically generated, detection steps can be automatically executed, detection reports can be automatically generated, the interference of artificial factors is reduced, the test randomness is removed, testing efficiency and testing reliability are improved, testing repeatability is achieved, the traceability of testing work is guaranteed, and the reliability and consistency of the test result are guaranteed.
Owner:STATE GRID CORP OF CHINA +1

Gear dynamic stress test device

The invention discloses a gear dynamic stress test device, comprising a motor, speed increasing gear, an accessory transmission system, a strain gage, a sliding ring electricity introducing device, and a dynamic analysis system. The motor is used as a power source for dragging; the speed increasing gear is connected to the motor for accelerating the rotation speed of the motor and transmitting the rotation speed to the accessory transmission system; the accessory transmission system comprises a gear to be tested and an engine accessory and/or a plane accessory which are installed on a gear to be tested; the strain gage is arranged on a spoke plate for collecting strain signals of the gear to be detected; the slip ring electricity introducing device is connected to the strain gage for transmitting the strain signal of the gear to be tested; the dynamic analysis system is connected to the slip ring electricity introducing device for performing amplification and conditioning on the strain signal of the gear to be tested which is transmitted to the slip ring electricity introducing device and processing and outputting the dynamic strain signal. The invention effectively simulates the real working condition of the accessory transmission gear, the structure is simple and the reliability of the test is high.
Owner:CHINA AVIATION POWER MACHINE INST

Method and system for testing Expander backboard hard disk indicator light based on Linux system

The invention discloses a method for testing an Expander backboard hard disk indicator light based on a Linux system. The method comprises the steps of utilizing a tool kit to conduct state setting and state examination on the Expander backboard hard disk indicator light based on an SES theoretical basis and obtaining corresponding state data; integrating the testing process of at least one state of the Expander backboard hard disk indicator light into a shell script; detecting corresponding states of the Expander backboard hard disk indicator light, generating a testing result and recording the testing result, so that the test is finished. Compared with the prior art, not only can the Expander backboard hard disk indicator light be automatically tested, but also the testing result can be imported into a test log to facilitate viewing in the later period; the method is applicable to multiple RAID cards or SAS cards, testing personnel conveniently match a testing environment, the testing time is saved, and meanwhile, the testing reliability is improved. By modifying a slot number supported by the Expander, the script can be applied to multiple Expanders, and the universality and flexibility of the testing script are embodied.
Owner:ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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