System and method for testing reliability of mass storage system

Abstract

The invention discloses a system and a method for testing reliability of a mass storage system. The system comprises a data acquisition unit and a data analysis unit, wherein the data acquisition unit comprises a static test module, a 72-hour reliability test module, a recovery time test module, a bit error rate (BER) test module and a mean time between failures (MTBF) reference data acquisition module; the data analysis unit comprises a static test assessment module, a 72-hour reliability test result analysis module, a Markov analysis module, a Monte Carlo analysis module and a mean time to data loss (MTTDL) analysis module; and various performance indexes for reflecting a tested system are acquired by performing data acquisition and data analysis, performing comprehensive test on the aspects of static test, 72-hour reliability test, fault injection-based reliability test and the like and performing analysis by adopting the Markov module, the Monte Carlo module and a disk array MTTDL, so the technical problem that the reliability evaluation system in the prior art cannot comprehensively reflect the reliability of the mass storage system. The system and the method are particularly suitable for reliability test of the mass storage system.

Description

Reliability testing system and testing method for mass storage system technical field The invention relates to a reliability evaluation system of a storage system, in particular to a reliability test and evaluation system of a mass storage system. Background technique As the technology adopted by modern information systems becomes more and more advanced, information systems tend to become larger and more complex. In the field of data processing applications, extremely high data throughput is required, which requires mass storage systems to meet the demand. Most of the existing storage test benchmark tools are oriented to small-scale storage systems, and most of them only care about the efficiency of storage systems. For example, Chinese patent document CN101630534A discloses a method and device for testing the reliability of a nonvolatile memory, in which N blocks are respectively selected from each of K nonvolatile memories each having Nm blocks, and the The selected K×...

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Problems solved by technology

For this reason, the technical problem to be solved by the present invention is that the reliability evaluation system in the prior art cannot

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