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6 results about "Mean time between failures" patented technology

Mean time between failures (MTBF) is the predicted elapsed time between inherent failures of a mechanical or electronic system, during normal system operation. MTBF can be calculated as the arithmetic mean (average) time between failures of a system. The term is used for repairable systems, while mean time to failure (MTTF) denotes the expected time to failure for a non-repairable system.

Method for verifying average fault-free time of solid state disk

ActiveCN121237187AStatic storageAcceleration factorValidation methods
The invention relates to the technical field of data storage, and discloses a method for verifying average fault-free time of a solid state disk, which comprises the following steps of: initializing a test environment of the solid state disk; a dynamic comprehensive stress model is constructed, acceleration factors are calculated based on self-adaptive parameters of reliability, in the testing process, the acceleration factors are added, different read-write load combinations are circularly switched according to set time slices, and testing of the solid state disk is accelerated; judging whether the test reaches a preset duration or a trigger fault condition; if yes, analyzing solid state disk fault diagnosis and data analysis, and if not, returning to continue accelerated testing of the solid state disk. According to the method, the dynamic comprehensive stress model is constructed, and the temperature stress, the voltage stress, the read-write load stress and other multi-dimensional stress are combined, so that the limitation that only single static high-temperature stress is applied in a traditional test method is broken through, comprehensive stress test on the solid state disk is realized, and the test comprehensiveness and accuracy are improved.
Owner:SHENZHEN JINGCUN TECH CO LTD

A device maintenance optimization method

The application discloses a device maintenance optimization method, comprising the following steps: classifying device faults into impact wear type faults and random type faults, and counting the occurrence intervals of various faults and the maintenance time after the faults occur; obtaining the average fault interval H0 of the impact wear type faults according to the statistics of the fault occurrence intervals; comparing the average fault interval H0 of the impact wear type faults with an order cycle h0; when H0>h0, it is not recommended to maintain within the order cycle; when H0 is less than h0, evaluating the inevitable loss Y caused by the impact wear type faults and the impact loss X; when XkY, it is not recommended to maintain within the order cycle; when X>kY, it is recommended to maintain before the end of the average fault interval; wherein, k is a preset parameter, and k is negatively correlated with X. Through the maintenance optimization method, it is determined whether and when the shutdown maintenance is needed, which has important guiding significance for production, especially in the case of tight order tasks.
Owner:CHINA TOBACCO JIANGXI IND CO LTD

Switched reluctance motor reliability evaluation method considering repair rate

This invention discloses a dimension-reduction reliability assessment method for switched reluctance motors (SRMs) that considers repairability. This method analyzes the faults of the SRM at structural levels, comprehensively converting the failure probabilities of each underlying component into overall system state transition parameters. Based on this, the repairability rate is calculated according to the actual periodic maintenance cycle of the equipment, and a Markov state transition equation system containing maintenance recovery paths is established. To avoid complex calculus operations involving high-order matrices, this invention utilizes Laplace transform to convert the dynamic process into algebraic calculations in the complex frequency domain, achieving analytical order reduction of the model. By performing algebraic analysis on the complex frequency domain function, the dynamic reliability function and mean time between failures (MTBF) of the system are directly obtained. This invention overcomes the shortcomings of traditional models, such as cumbersome computation and unrealistic lifespan predictions. While effectively reducing the computational complexity of microcontrollers, it significantly improves the accuracy of lifespan prediction for motor drive systems and enhances their engineering application value.
Owner:YANCHENG INST OF TECH +1

A method and apparatus for reliability assessment of equipment condition monitoring system

This invention discloses a method and apparatus for reliability assessment of an equipment condition monitoring system, comprising: configuring weight coefficients for each system function of the equipment condition monitoring system to be assessed according to the current monitoring target; selecting a first data type for the equipment condition monitoring system to be assessed according to the current monitoring target and collecting first data corresponding to the first data type; calculating the stability of the data trend prediction result based on the first data; selecting a second data type for the equipment condition monitoring system to be assessed according to the current monitoring target and collecting second data corresponding to the second data type; calculating the mean time between failures (MTBF) assessment result based on the second data; verifying the data trend prediction result and the MTBF assessment result, and determining the reliability assessment result of the equipment condition monitoring system to be assessed based on the verification result and the weight coefficients. This solution can perform in-depth assessment and judgment of the reliability of the equipment condition monitoring system.
Owner:HUADIAN ELECTRIC POWER SCI INST CO LTD

Low-temperature reliability verification method for extreme low-temperature environment storage equipment and verification platform thereof

PendingCN122282361AValidation methodsSimulation
This invention provides a method and platform for verifying the low-temperature reliability of warehousing equipment in extreme low-temperature environments. The method includes: moving the equipment to be verified into a low-temperature test chamber with a preset target low-temperature environment based on human-computer interaction commands for cyclic operation simulation tests; collecting multi-source monitoring parameters of the equipment under verification in real time under the target low-temperature environment based on the cyclic operation simulation tests; identifying weak points and analyzing faults based on the multi-source monitoring parameters to obtain high-risk weak points and mean time between failures (MTBF); and performing compliance determination and integration based on the multi-source monitoring parameters, the high-risk weak points, and the MTBF to obtain a standardized verification report. This invention improves verification efficiency and the accuracy of verification results, meeting the practical needs of low-temperature reliability verification for warehousing equipment in extreme low-temperature environments.
Owner:HUBEI INST OF MATERIAL CIRCULATION TECH

A method for verifying mean time between failures of a solid state drive

ActiveCN121237187BStatic storageAcceleration factorValidation methods
The application relates to the technical field of data storage, and discloses a verification method for mean time between failures of a solid state disk, which comprises the following steps: initializing a test environment of the solid state disk; constructing a dynamic comprehensive stress model; calculating an acceleration factor based on adaptive parameters of reliability; in a test process, increasing the acceleration factor, cyclically switching different read-write load combinations according to a set time slice, and accelerating the test of the solid state disk; judging whether the test reaches a preset time length or triggers a failure condition; if yes, analyzing solid state disk failure diagnosis and data analysis; and if no, returning to continue accelerating the test of the solid state disk. Through the construction of the dynamic comprehensive stress model, the method combines temperature stress, voltage stress and read-write load stress and other multidimensional stresses, breaks through the limitation of traditional test methods which only apply single static high-temperature stress, realizes comprehensive stress testing of the solid state disk, and improves the comprehensiveness and accuracy of the test.
Owner:SHENZHEN JINGCUN TECH CO LTD