Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Digital image analysis method for obtaining object deformation quantity

A digital image and analysis method technology, which is applied in image analysis, image data processing, instruments, etc., can solve the problems of long time consumption, and achieve the effect of simple method, wide application range and fast acquisition

Active Publication Date: 2014-12-10
HUAZHONG UNIV OF SCI & TECH
View PDF4 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the above defects or improvement needs of the prior art, the present invention provides a digital image analysis method for obtaining the deformation of an object, the purpose of which is to obtain the displacement of the object due to its own deformation without contacting the components and causing no damage to the components. Image processing technology analyzes the deformation of objects, and can quickly obtain results, thereby solving the technical problems of needing to contact the surface of the object or taking a long time for processing steps in the current method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Digital image analysis method for obtaining object deformation quantity
  • Digital image analysis method for obtaining object deformation quantity
  • Digital image analysis method for obtaining object deformation quantity

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0027] An embodiment comprises the following steps:

[0028] S1: Use the camera at the same position to take images of objects with speckle on the surface before and after deformation, as shown in Figure 1, Figure 1(a) is a photo of the speckle part before deformation, and Figure 1(b) is the speckle part after deformation , the two images include the same part, namely the speckle part.

[0029] S2: Randomly select an analysis area in the area near the speckle in the two images. The two analysis areas have the same shape, both are square, and the number of pixels contained in the two areas is also the same. In this embodiment, the deformation The starting coordinates of the pixels selected in the pre- and post-warping images are both (350, 150), the ending pixel coordinates are both (450, 250), and the size of the analysis area is 101×101.

[0030] S3: Fast Fourier transform is performed on the gray values ​​of the pixels in the two areas respectively, and the first transforma...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a digital image analysis method for obtaining object deformation quantity. The digital image analysis method for obtaining the object deformation quantity includes steps: S1, obtaining object images before and after deformation; S2, respectively selecting analysis areas of the same coordinate from the same portion of the same object in two images; S3, respectively performing fast Fourier transformation and mathematical treatment on gray values of pixel dots in the two analysis areas so as to obtain functions related to the gray values and the deformation quantity of the pixel dots in the two analysis areas and related to a variable in the mathematical treatment; S4, respectively calculating four different functions obtained when four different fixed values are respectively assigned to the variable in the mathematical treatment; S5, performing the mathematical treatment on the four different functions obtained in the step S4 so as to obtain a fifth function; S6, performing the Fourier transformation on the fifth function so as to obtain an impulse function including the object deformation quantity, and performing calculation so as to obtain the position of the highest impulse point in the impulse function, wherein the coordinate of the position of the highest impulse point in the impulse function is the deformation quantity caused by object deformation in the X axis direction and the Y axis direction.

Description

technical field [0001] The invention belongs to the field of engineering measurement, and more specifically relates to a digital image analysis method for obtaining the deformation amount of an object. Background technique [0002] Measuring the structural deformation of materials to obtain their mechanical properties has always been an important topic concerned by the majority of mechanics workers. In the mechanical behavior experiment of materials, the material is usually made into a standard sample, and then the deformation of the sample is obtained by means of an extensometer, and the mechanical properties of the material can be calculated according to the deformation of the material. In the early days, mechanical lever extensometers were used, and now strain-type extensometers are usually used. The sensitive deformation element on the strain-type extensometer is a cantilever beam made of elastic material. The free end of the cantilever beam is a knife edge. The test pi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00
Inventor 何玉明葛慧
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com