Hybrid general test device

A general-purpose testing and mixed-assembly technology, which is applied in the direction of measuring devices, measuring device casings, and measuring electronics, can solve problems such as poor versatility and low reliability, and achieve compact structure, high reliability, and strong environmental adaptability. Effect
CN104297526AInactive Publication Date: 2015-01-21LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
Publication Date
2015-01-21
Estimated Expiration
Not applicable ยท inactive patent

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Abstract

The invention relates to a hybrid general test device and belongs to the technical field of an avionic test. A case of a hybrid general test device adopts an upturning structure; a display plate is arranged at the upper portion of the case and a case body is arranged at the lower portion; and the display plate and the case body are connected through a rotation shaft and corner fittings. The case is compact in structure, beautiful in appearance and convenient to carry. A test circuit comprises a backboard, a processor module, a power module and a resource module, wherein the modules are connected correspondingly through the backboard. The front panel of case body is provided with control switches and indicator lights. The panels at the left and right two sides of the case body are respectively provided with a ventilation opening, wherein the two ventilation openings form an air channel. The hybrid general test device is high in reliability, and high in environment adaptability; bus bandwidth is in high and low cooperation, and the heat dissipation performance is good; and the hybrid general test device can meet the test simulation demands of different systems under test.
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Description

technical field

[0001] The invention relates to a mixed general testing device, which belongs to the technical field of avionics testing. Background technique

[0002] With the development of computer bus technology and the update of measurement and control requirements, the demand for building some high-speed or high-speed and medium-speed mixed test resource platforms is increasing. At present, most of the computer products supporting design in the market are PCI-e mixed bus structure. , using the "golden finger" form, the contact surface is easy to oxidize and loosen after a long time, and the development carrier as a test platform has low reliability and poor versatility. The PXI-e bus expansion test platform with the same bandwidth as the PCI-e bus can better overcome the above shortcomings, but there are few types and suppliers, the selection space for related test systems is small, and the design work is relatively inconvenient. Convenience, the development requireme...

Claims

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