Power-up aging test device for liquid crystal display module

A liquid crystal display module and test device technology, applied in nonlinear optics, instruments, optics, etc., can solve the problems of no display, abnormal display, and no vibration of the crystal oscillator in the liquid crystal display module, so as to ensure accuracy and stability, The effect of improving convenience

Inactive Publication Date: 2015-01-21
冀雅(廊坊)电子股份有限公司
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Problems solved by technology

[0002] At present, the power-on aging test device of the liquid crystal display module is to put the test board, the test tooling, and the liquid crystal display module into the aging test box together, which causes the test device to carry out the power-on aging test together with the liquid crystal display module. Obviously, This method has very high requirements on the test equipment, which is not conducive to reducing costs and improving test efficiency. At the same t

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  • Power-up aging test device for liquid crystal display module

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[0011] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0012] refer to figure 1 , is a functional block diagram of a liquid crystal display module power-on aging test device according to an embodiment of the present invention.

[0013] The liquid crystal display module power-on aging test device provided by the embodiment of the present invention is characterized in that it includes a test board 1 arranged outside the aging test box and a data receiving board 2 arranged inside the aging test box. The boards are connected by a serial port extension line 3; the test board 1 includes a test data sending module 101 and a first level conversion module 102, and the data receiving board 2 includes a second level conversion module 201, a serial-to-parallel conversion module 202 and m...

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Abstract

The invention discloses a power-up aging test device for a liquid crystal display module. The power-up aging test device comprises a test board arranged outside an aging test chamber, and a data receiving board arranged in the aging test chamber. The test board and the data receiving board are connected through a serial port extension cord. The test board comprises a test data transmitting module and a first level switch module. The data receiving board comprises a second level switch module, a series-to-parallel module and a plurality of test interfaces used for being connected with the liquid crystal display module. According to the power-up aging test device for the liquid crystal display module, as the test board is arranged outside the aging test chamber, continuous operation of the test board is ensured, and the purpose of the power-up aging test is achieved; meanwhile, as the test board and the data receiving board are connected through the serial port extension cord, the distance between the test board and the data receiving board can be up to more than 15 meters, and the convenience of the aging test is greatly improved.

Description

technical field [0001] The invention relates to the field of liquid crystal display module testing devices, in particular to a liquid crystal display module power aging test device. Background technique [0002] At present, the power-on aging test device of the liquid crystal display module is to put the test board, the test tooling, and the liquid crystal display module into the aging test box together, which causes the test device to carry out the power-on aging test together with the liquid crystal display module. Obviously, This method has very high requirements on the test equipment, which is not conducive to reducing costs and improving test efficiency. At the same time, this test method often has problems such as program not running, crystal oscillator not vibrating, and liquid crystal display module not displaying. The purpose of the continuity of the electrical aging test. In addition, when using this method for power-on aging, the cable length between the test boar...

Claims

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Application Information

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IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 杜善伍程俊改霍学鹏齐学静
Owner 冀雅(廊坊)电子股份有限公司
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