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Ultra-low power non-volatile memory based on standard process

An ultra-low power consumption, non-volatile technology, applied in the field of microelectronics, can solve the problem of high power consumption, and achieve the effect of reducing high voltage, reducing application cost, and reducing technology development cycle

Active Publication Date: 2017-12-22
NAT UNIV OF DEFENSE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide an ultra-low power consumption non-volatile memory structure based on a standard process to solve the deficiencies in the prior art. Its programming and erasing operations are completed using the FN tunneling effect to solve the power consumption High problem; using a pseudo-differential structure, the output differential signal increases the reliability of its reading, and helps to cooperate with the sensitive amplifier of the differential structure to increase the reading speed

Method used

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  • Ultra-low power non-volatile memory based on standard process
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  • Ultra-low power non-volatile memory based on standard process

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Embodiment Construction

[0030] The ultra-low power consumption non-volatile memory based on the standard process according to the embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

[0031] Such as Figure 7As shown, the present invention is composed of exactly the same storage units. In this example, there are 16 storage units, that is, the memory capacity is 16 bits, but it is not limited to 16 bits. The actual storage capacity can be increased according to demand, and block storage can be used array to increase storage capacity. From Figure 7 It can be seen that in each row, the tunneling ports TP of all storage units are connected together; all the selection ports SP are connected together; in each column, all the read ports RP are connected together; all control ports CP are connected together Together, this constitutes the structure of the entire memory.

[0032] Such as figure 1 As shown, each memory cell includes two incompl...

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Abstract

The invention discloses an ultra-low power consumption non-volatile memory based on a standard process, which includes a plurality of storage units, and is characterized in that each storage unit includes two different modules, and module A consists of a control tube MA01, a first Tunneling tube MA02, first reading tube MA03 and selection tube MA04 are connected with four transistors; module B is composed of four transistors connected with control tube MB01, second tunneling tube MB02, second reading tube MB03 and selection tube MB04 ; It consists of two modules A and B that are not completely symmetrical, and use the difference in threshold voltage of PMOS and NMOS devices to output current differential signals of different sizes. The two modules A and B are always erased or programmed at the same time. Simple and convenient, the storage unit of the present invention outputs a differential signal, and the difference of the output differential signal is very large, so the reading speed of the unit is relatively fast and the reliability is high.

Description

technical field [0001] The invention belongs to the field of microelectronic technology, and relates to the storage technology of semiconductor integrated circuits, more specifically, an ultra-low power consumption non-volatile memory based on standard technology. Background technique [0002] Many integrated electronic devices require some amount of non-volatile memory. Usually non-volatile memory is used as an independent memory outside the chip or as a memory in the tag chip, mainly to store some control programs, processing instructions or items related to the chip for a long time without power supply. information and more. [0003] Several types of non-volatile memory commonly used at present mainly include erasable programmable read-only memory EPROM, electrically erasable programmable read-only memory EEPROM and flash memory Flash Memory. In addition, there are ferroelectric memory FeRAM, magnetic random access memory MRAM and phase change memory OUM and other new t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C16/02G11C16/06
Inventor 李文晓李建成李聪尚靖王震郑黎明曾祥华吴建飞
Owner NAT UNIV OF DEFENSE TECH