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569results about How to "Increase write speed" patented technology

Smart verify for multi-state memories

The present invention presents a “smart verify” technique whereby multi-state memories are programmed using a verify-results-based dynamic adjustment of the multi-states verify range for sequential-state-based verify implementations. This technique can increase multi-state write speed while maintaining reliable operation within sequentially verified, multi-state memory implementations. It does so by providing “intelligent” means to minimize the number of sequential verify operations for each program/verify/lockout step of the write sequence. In an exemplary embodiment of the write sequence for the multi-state memory during a program/verify cycle sequence of the selected storage elements, at the beginning of the process only the lowest state of the multi-state range to which the selected storage elements are being programmed is checked during the verify phase. Once the first storage state is reached by one or more of the selected elements, the next state in the sequence of multi-states is added to the verify process. This next state can either be added immediately upon the fastest elements reaching this preceding state in the sequence or after a delay of several program cycles. The adding of states to the set being checked in the verify phase continues through the rest of the set of multi-states in sequence, until the highest state has been added. Additionally, lower states can be removed from the verify set as all of the selected storage elements bound for these levels verify successfully to those target values and are locked out from further programming.
Owner:WODEN TECH INC

Novel static random access memory (SRAM) storage unit preventing single particle from turning

ActiveCN102723109ARealize the ability of flip reinforcementReduce rollover recovery timeDigital storageStatic random-access memoryClock network
The invention discloses a novel static random access memory (SRAM) storage unit preventing a single particle from turning. The storage unit comprises a first input/output port, a first potential turning recovery driving circuit, a voltage retaining circuit, a second potential turning recovery driving circuit and a second input/output port which are connected in series with one another sequentially. An automatic recovery function for voltage turning when a sensitive node is impacted by a high-energy particle can be realized; according to a simulation result of a TSMC 0.18 mu_m process, a turning threshold value LETth is more than 500 MeV/(mg.cm<2>); compared with the conventional storage unit preventing the single particle from turning, the SRAM storage unit has the characteristic of high writing speed; the recovery time can be effectively shortened; by adopting a unidirectional clock and a small-clock amplitude, a clock network is relatively simple and relatively high in reliability; the clock is only connected with the gate of a read-write transistor, and the clock load is relatively small; and the sensitive node can be used for reinforcing multi-node turning of the single particle, which is caused by drains positioned on a P-type tube and an N-type tube..
Owner:XI AN JIAOTONG UNIV
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