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Probe block for detection and detection device thereof

A detection device and probe block technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of display panel defect detection rate, reduce production cost, probe short circuit, etc., and improve the defect detection rate , reduce production costs, and ensure the effect of display quality

Active Publication Date: 2018-02-16
HEFEI XINSHENG OPTOELECTRONICS TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Embodiments of the present invention provide a detection probe block and a detection device thereof, which solves the problem of a short circuit between probes when the existing probe block is used to detect a display panel, and avoids failure of the display panel to be detected. The occurrence of defective conditions improves the defective detection rate of the display panel, ensures the display quality of the display panel images, furthermore, avoids the waste of production materials and reduces the production cost

Method used

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  • Probe block for detection and detection device thereof
  • Probe block for detection and detection device thereof
  • Probe block for detection and detection device thereof

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Embodiment Construction

[0031] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0032] The embodiment of the present invention provides a probe block for detection, which is used in the detection of a display panel, refer to figure 1 with figure 2 As shown, the probe block includes a probe 1, and the probe block has a first probe area 2 corresponding to the lead 13 in the display panel, wherein:

[0033] Such as figure 2 As shown in the above, the probe 1 in the first probe area 2 on the probe block is arranged at a ...

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Abstract

Embodiments of the present invention provide a probe block for detection and a detection device thereof, which relate to the field of display technology and solve the problem of short circuit between probes when the existing probe block is used to detect a display panel, avoiding failure The defect detection of the display panel occurs, which improves the defect detection rate of the display panel, ensures the display quality of the display panel images, and further avoids the waste of production materials and reduces the production cost. The probe block includes: applied to the detection of the display panel, the probe block includes probes, and the probe block has a first probe area corresponding to the lead wires in the display panel, wherein: in the first probe area The probe is set at the position corresponding to the first lead in the connected leads in the display panel, and no probe is set at the position corresponding to the lead adjacent to the first lead; wherein, the first lead is any of the connected leads a lead. The invention is applied in the detection of the display panel.

Description

Technical field [0001] The invention relates to the field of display technology, in particular to a probe block for detection and a detection device thereof. Background technique [0002] After the liquid crystal panel is formed into a box, in order to detect defective products in the manufacturing process, prevent the defective panel from being put into the subsequent process, and reduce the waste of production resources, it is necessary to perform the box inspection. Under the development trend of large-size panels, high resolution, and high refresh rate, in order to reduce the impact of testing equipment on the detection rate of defective products, a short-circuiting bar wiring design is generally used in large-size panels. [0003] In order to improve the resolution of the display, it is necessary to reduce the pitch of the leads in the panel, so that the pitch of the probes in the probe block used for panel inspection will also be reduced. As the distance between adjacent pro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13G01R1/067
CPCG01R1/06733G02F1/1309G01R1/07307G01R1/067G09G3/006G09G3/36
Inventor 盛化鹏吴松张林韦传兵田林山
Owner HEFEI XINSHENG OPTOELECTRONICS TECH CO LTD
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