Simulation testing device for mutual inductor of LTE wireless communication intelligent substation

Abstract

The invention relates to a simulation testing device for a mutual inductor of an LTE wireless communication intelligent substation. The simulation testing device for the mutual inductor of the LTE wireless communication intelligent substation comprises a master simulation station, a first LTE wireless transceiving module, a second wireless transceiving module, a distributed data terminal and a power amplification circuit. The simulation testing device for the mutual inductor of the LTE wireless communication intelligent substation has the benefits of being convenient to carry and assemble and widely applicable to field mounting debugging test, outage maintenance test and technical performance evaluation of the substation. Near-end experimental equipment is arranged beside field equipment at different intervals respectively and is connected with far-end equipment in an LTE wireless local area private network mode, and a debugging operator does not need to carry optical fibers additionally; the running state of most of electric power systems can be accurately simulated, and the working conditions of secondary equipment for protection, measurement and control are investigated; meanwhile, a plurality of interval correlation protection, measurement and control devices are connected, so that the complete testing of a secondary system of the whole substation is achieved, and the field workflow is optimized.

Description

technical field [0001] The invention belongs to the technical field of intelligent substation testing, and relates to a simulated testing device for a transformer of an LET wireless communication intelligent substation. Background technique [0002] Based on the DL860 standard (IEC61850 standard), the smart substation adopts advanced technologies such as digital sampling, intelligent primary equipment and optical fiber Ethernet. It has the characteristics of digitalization, networking and information sharing in the whole station. Detection, commissioning and testing put forward higher requirements. [0003] Smart substation testing is a key link to ensure the smooth operation of smart substations. The reliability and effectiveness of secondary equipment and system functions in smart substations depend on the guarantee of testing technology. The test of the secondary equipment of the smart substation should not only include the unit detection of the merging unit, intelligen...

AI Technical Summary

Problems solved by technology

[0005] 1) Smart substations have the characteristics of digital communication, networking, and information sharing across the station. Traditional secondary equipment test tools can only send and receive test data in a fixed format, and complete individual tests for specific equipment and single functions. The reliability and effectiveness of the overall function;

[0006] 2) The configuration modes of the secondary system of the smart substation in operation are diverse, the manufacturers of the secondary equipment are complicated, and there are large differences in the equipment networking mode and the communication protocol adopted. At present, there is no test tool that can be used universally for different types of smart substations test tasks;

[0007] 3) At present, the protection of the interval layer of the intelligent substation is arranged in the protection room, while the process layer merging unit and the intelligent terminal are scattered and arranged on the spot; in view of this distributed layout, affected by the space distance and the environment, the entire group of intervals in the substation site is connected to the flow pressure and function. It is difficult to realize the transmission, which brings certain hidden dangers to the safe and stable operation of the substation;

[0008] 4) It is impossible to conduct a comprehensive performance test on the secondary equipment before installation, so this part of the work can only be arranged in the on-site debugging link, which makes the debugging work extremely heavy

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