Test device capable of performing multiple tests simultaneously and test method

Abstract

The invention relates to a test device capable of performing multiple tests simultaneously and a test method. In order to achieve the purpose, the test device provided by the invention is characterized by comprising a rotary plate, a plurality of cables and a driving control portion, wherein the rotary plate is provided with N test stands with the N being a natural number, and the rotary plate is configured in a rotatable mode; the plurality of cables are electrically connected with the N test stands respectively; and the driving control portion controls rotation actions of the rotary plate, the driving control portion enables the rotary plate to rotate forward by 360 / N degrees when tests simultaneously performed on the N test stands are finished, and the driving control portion enables the rotary plate to rotate reversely by 360(1-1 / N) degrees when all tests of each test stand are finished.

Description

technical field [0001] The present invention relates to a testing device and method capable of performing multiple tests simultaneously, and more specifically, to a testing device and method using a turntable arranged so that multiple tests can be performed simultaneously. Background technique [0002] Such as Figure 5 As shown, a test apparatus 10 for testing objects such as a camera module, a mobile phone, and a music player substrate uses a turntable 11 having a plurality of test stands, for example, four test stands 11a, 11b, 11c, and 11d. In the state where the same object is placed on the respective test stands 11a, 11b, 11c, and 11d of the turntable 11, the respective test stands 11a, 11b, 11c, and 11d are simultaneously subjected to different tests. Then, when one simultaneous test is completed, the turntable 11 is rotated to perform another test on each object. [0003] By performing the test on the object in this way, four tests can be carried out on the test sta...

AI Technical Summary

Problems solved by technology

[0006] As such a connection terminal 12, a telescopic probe (pogopin) 12a of a conductive object is mainly used, but there is a problem that the telescoping probe 12a is worn out due to continuous use, so that there is a problem with the electrical connection, or there is a problem in the electrical connection. The problem of poor connection due to foreign objects caught in the connection terminal 12

As a result, the test results of the objects tested on the test benches 11a, 11b, 11c, and 11d may not be normally transmitted to the tester, resulting in failure to perform normal tests.

[0007] In addition, every time the electrical connection of the connection terminal 11 is repeatedly disconnected and then reconnected, it is necessary to re-identify or initialize the test object for the test in each test stand 11a, 11b, 11c, 11d, so time loss occurs. question

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