A cable fault detection test system and its working method

Abstract

The invention discloses a cable fault detection test system and a working method thereof. The system includes a microprocessor, DDS signal generators 1 and 2 that generate two channels of rectangular wave signals with the same frequency and amplitude, and adjustable inductors 1 and 2 that are connected in series between DDS 1 and 2 and the cable under test, respectively. Feedthrough current transformers 1 and 2 connected in parallel with inductors 1 and 2 respectively, adjustable standard capacitors 1 and 2 connected in series between current transformers 1 and 2 and the ground terminal respectively, and both of them are connected to the ground terminal, respectively The peak detectors 1 and 2 connected in series with the current transformers 1 and 2, the multiplier for calculating the correlation of the output signals of the detectors 1 and 2, and the analog-to-digital converter for sending the output voltage signal of the multiplier to the microprocessor after modulo-to-digital change . Compared with the prior art, the present invention is based on a double-channel symmetrical rectangular wave test signal, realizes efficient detection of cable faults, has low requirements on test signal waveform quality, low signal sampling rate, simple system structure, easy implementation, and low cost.

Description

technical field [0001] The invention relates to a cable fault detection test system, in particular to a cable fault detection test system based on two-way symmetrical rectangular wave test signals and a working method thereof. Background technique [0002] The traditional cable fault detection method is based on the analysis of the frequency or intensity of the reflected signal, and the fault location is identified by analyzing the time difference between the reflected signal and the reflected signal. However, because the reflected signal is easily distorted by the environment, it is difficult to obtain an accurate fault location, especially in the case of heavy interference and many defect points on site. At present, the analysis technology using frequency domain oscillatory wave has high frequency, difficult calibration and high acquisition rate, which makes the overall cost high. Contents of the invention [0003] The purpose of the present invention is to address the ...

AI Technical Summary

Problems solved by technology

However, because the reflected signal is easily distorted by the environment, it is difficult to obtain an accurate fault location, especially in the case of heavy interference and many defect points on site

At present, the analysis technology using frequency domain oscillatory wave is high in frequency, difficult to calibrate, and high in acquisition rate, which makes the overall cost high.

Images