A high-voltage ceramic capacitor ceramic dielectric chip on-line appearance inspection and chamfering device

A technology of appearance inspection and high-voltage ceramics, applied in the direction of fixed capacitor dielectric, capacitor, capacitor manufacturing, etc., can solve the problems of uneven chamfering, low production efficiency, high labor intensity, etc., and achieve uniform chamfering and high production efficiency.

Active Publication Date: 2018-02-13
苏州奥立登科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This kind of artificial chamfering is not only labor-intensive and low in production efficiency, but also, the chamfering is uneven, and pits or missing chamfers are prone to occur.

Method used

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  • A high-voltage ceramic capacitor ceramic dielectric chip on-line appearance inspection and chamfering device
  • A high-voltage ceramic capacitor ceramic dielectric chip on-line appearance inspection and chamfering device

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Experimental program
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Embodiment Construction

[0023] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific preferred embodiments.

[0024] like figure 1 and figure 2 As shown, an online appearance detection and chamfering device of a high-voltage ceramic capacitor porcelain dielectric chip, which includes a base 1, a rotating shaft 2, a lower mold 3, an upper mold 4, a pressure sensor 41, an adsorption electromagnet 42, a support rod 5, a horizontal Rod 51, rotating bearing 6, computer 7, automatic transmission line 8, burr removal station 81, positioning electromagnet 811, appearance inspection station 82, defective product box 9, porcelain dielectric chip 10, burr removal device 11, appearance inspection device 12. Main technical features such as vertical probe 121 and horizontal probe 122.

[0025] An on-line appearance inspection and chamfering device of a high-voltage ceramic capacitor ceramic dielectric chip, including an automatic transmission ...

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PUM

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Abstract

The invention discloses a high-voltage ceramic capacitor ceramic dielectric chip on-line appearance detection and chamfering device which comprises an automatic transmission line, an appearance detection device, a deburring device, a computer and a nonconforming product box. A deburring station and an appearance detection station are arranged on the automatic transmission line. The deburring device comprises a positioning electromagnet. The appearance detection device is arranged on the automatic transmission line upstream or downstream the deburring device. The appearance detection device comprises vertical and horizontal probes. Vertical and horizontal probes are connected with the computer. The vertical probe is located right above a ceramic dielectric chip on the automatic transmission line. Through the structure, the on-line appearance detection and chamfering device can automatically detect the appearance of the ceramic dielectric chip, and has the advantages of automatic and online deburring, uniform chamfering, high automation degree, low labor intensity and high production efficiency.

Description

technical field [0001] The invention relates to the production field of ceramic capacitors, in particular to an online appearance detection and chamfering device for porcelain dielectric chips of high-voltage ceramic capacitors. Background technique [0002] Traditional discrete components—ceramic capacitors are mainly in the form of discs. This structure is simple to form, mature in technology, easy to operate, and convenient for batch and large-scale production. [0003] However, in the molding and pressing stage of the ceramic dielectric chip in the ceramic capacitor, even if the process corner is designed, there will still inevitably be sharp chamfered parts. Because the sharp part will cause poor painting of the corners in the subsequent spraying process, resulting in poor pressure resistance, therefore, after the molding and pressing are completed, it is required to chamfer the corners of the ceramic dielectric chip. However, the chamfering method of the existing cera...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01G13/00H01G4/12
CPCH01G4/12H01G13/00
Inventor 钱云春
Owner 苏州奥立登科技有限公司
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