A multiple reflection component

A technology of multiple reflections and components, applied in the field of optical detection, can solve the problems of inability to achieve effective optical path and limited number of reflections, and achieve the effect of increasing the shuttle stroke and meeting the detection requirements

Active Publication Date: 2019-03-19
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It can be seen from the figure that this method is limited by the size of the spherical mirror, and its reflection times are limited. When measuring ultra-trace gases, it still cannot reach the effective optical path

Method used

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  • A multiple reflection component
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  • A multiple reflection component

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Embodiment Construction

[0020] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0021] Such as image 3 , 5 As shown, a multiple reflection assembly includes a primary mirror 1 and a secondary mirror 3, the primary mirror 1 is composed of a spherical mirror, and the secondary mirror 3 is composed of two spherical mirrors, namely a first spherical mirror 3a and a second spherical mirror 3b, The mirror surfaces of the primary mirror 1 and the secondary mirror 3 are arranged oppositely; the incident light enters from one side of the primary mirror 1, and hits the first spherical mirror 3a of the secondary mirror 3, and converges on the primary mirror 1 after being reflected by the first spherical mirror 3a Then, the second spherical mirror 3b, the main mirror 1, the first spherical mirror 3a, the main mirror 1, and the second spherical mirror 3b undergo multiple circular reflections in sequence until the reflected light of the secondary mirror 3 d...

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Abstract

The invention belongs to the technical field of optical detection and particularly relates to a multiple-reflection component. The multiple-reflection component comprises a primary mirror and two secondary mirrors; a right-angled reflection mirror is arranged on each of the two sides of the primary mirror; when a reflected light beam deviates from the primary mirror through multiple reflections between the primary mirror and the secondary mirrors, a reflection point on the side of the primary mirror is enabled to deviate by utilizing the characteristic that the right-angled reflecting mirrors can return the deviated light beam in the original direction, so that a group of new reflection paths are formed; through each of the right-angled reflecting mirrors, the light paths are doubled; the light paths are greatly increased through back-and-forth shuttling of an infrared light beam between the primary mirror and the secondary mirror, and the detection requirements of ultra-trace gas can be satisfied.

Description

technical field [0001] The invention belongs to the technical field of optical detection, and in particular relates to a multiple reflection component. Background technique [0002] In the prior art, a spectrometer is often used to detect the gas concentration. The principle is that when the infrared beam passes through the gas to be measured, the gas will absorb the infrared signal. According to the Lambert-Beer law, the absorbance of gas molecules is proportional to the absorption path, the concentration of gas molecules and the absorption coefficient of gas molecules. Different gas molecules have different gas molecule absorption characteristics. Therefore, the concentration of absorbed gas molecules can be quantitatively retrieved by performing spectral analysis on the absorbance spectrum after gas absorption. However, when the gas concentration is too low, the absorbance of the gas molecules is weak, and the absorption spectrum is not obvious. At this time, the absorb...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/01G01N21/3504
CPCG01N21/01G01N21/3504G01N2201/06
Inventor 李相贤王亚萍陈军石建国童晶晶李胜高闽光张玉钧刘文清
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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