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Simulation method and apparatus

A simulation method and simulation software technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as low efficiency of test circuits

Inactive Publication Date: 2017-03-08
STATE GRID BEIJING ELECTRIC POWER +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Embodiments of the present invention provide a simulation method and device to at least solve the technical problem of low efficiency of the test circuit

Method used

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Embodiment Construction

[0032] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0033] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate ...

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Abstract

The invention discloses a simulation method and apparatus. The method comprises the steps of connecting designed circuit diagrams according to connection relationships among components in the circuit diagrams in simulation software to form a to-be-tested circuit in the simulation software; configuring parameter values for the components in the simulation software through input controls; and determining whether the circuit works normally or not according to parameters output by parameter check points. According to the method and the apparatus, the technical problem of low circuit test efficiency is solved.

Description

technical field [0001] The invention relates to the field of circuit testing, in particular to a simulation method and device. Background technique [0002] In terms of various circuit design equipment, due to the large number of staff in various universities and units, and the limited number of instruments and equipment in the laboratory, there are certain difficulties in equipment supply. Not only that, all equipment components are aging and damaged , Maintenance, update and other issues, the cost is high, and at the same time, the connection through the actual components is heavy, and it is easy to cause human error. [0003] Aiming at the problem of low efficiency of the above-mentioned test circuit, no effective solution has been proposed so far. Contents of the invention [0004] Embodiments of the present invention provide a simulation method and device to at least solve the technical problem of low efficiency of the test circuit. [0005] According to an aspect o...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/30
Inventor 王钊陈建树宫成马丛淦宋振辉
Owner STATE GRID BEIJING ELECTRIC POWER
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