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Electrostatic protection circuit, electrostatic protection device and chip screening method

A technology for electrostatic protection and protective circuits, which is applied in the direction of circuits, electrical components, electric solid devices, etc., can solve problems such as inapplicability, and achieve the effect of avoiding electrostatic damage and improving the problem of electrostatic damage

Active Publication Date: 2019-03-19
高能瑞泰(山东)电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Not suitable for products with electrostatic sensitivity lower than 350V
Moreover, there are many items for component screening, such as multi-department and multi-laboratory cooperation, this method is not applicable

Method used

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  • Electrostatic protection circuit, electrostatic protection device and chip screening method
  • Electrostatic protection circuit, electrostatic protection device and chip screening method
  • Electrostatic protection circuit, electrostatic protection device and chip screening method

Examples

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Embodiment Construction

[0022] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for ease of description, only parts related to the invention are shown in the drawings.

[0023] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0024] Please refer to figure 1 , shows an exemplary circuit diagram of an electrostatic protection circuit according to an embodiment of the present application.

[0025] Such as figure 1 As shown, an electrostatic protection circuit is provided, and the electrostatic protection circuit include...

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Abstract

The invention discloses an electrostatic protection circuit, an electrostatic protection device and a chip screening method. The electrostatic protection circuit comprises a positive protection circuit, a negative protection circuit and a current limiting resistor, wherein the positive protection circuit comprises a first series unit; one end of the first series unit is connected with an input end of a chip and the other end is connected with a positive power supply end of the chip; the first series unit comprises at least two voltage stabilizing diodes which are reversely connected in series; the negative protection circuit comprises a second series unit; one end of the second series unit is connected with the input end of the chip and the other end is connected with a negative power supply end of the chip; the second series unit comprises at least two voltage stabilizing diodes which are reversely connected in series; and one end of the current limiting resistor is connected with the input end of the chip and the other end is connected with an input leading-out terminal. According to the electrostatic protection circuit, the electrostatic protection device and the chip screening method, the positive protection circuit, the negative protection circuit and the current limiting resistor are connected to the input end of the chip, so that the problem of electrostatic damage of an electrostatic sensitive component can be solved.

Description

technical field [0001] The present disclosure generally relates to the field of chip detection, specifically to the field of detection of electrostatic sensitive devices, and in particular to an electrostatic protection circuit, an electrostatic protection device and a chip screening method. Background technique [0002] In astronomical observations, more and more ASIC (Application Specific Integrated Circuit, application specific integrated circuit) dedicated chips are used to collect detector signals, for example, the multi-channel static-sensitive signal collection chip VA32TA6 is used. In order to improve the equivalent input noise of ASIC and other indicators of this type of chip, the input end of the chip will be drawn out by gate and the electrostatic protection circuit will be removed when designing the chip. Therefore, this type of ASIC is very sensitive to static electricity and is extremely vulnerable to static electricity damage. Especially when this type of pro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/02
CPCH01L27/0248
Inventor 雒涛曹学蕾王科李鲜孙亮杜园园孟斌顾煜栋刘少真
Owner 高能瑞泰(山东)电子科技有限公司
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