General processing method for testing assembly of different electronic devices

Abstract

The present invention provides a general processing method for testing assembly of different electronic devices. The method comprises: 1. establishing a protocol master file table, a sending variable slave list and a receiving variable slave list in one-to-one correspondence with different electronic devices; 2. according to an instruction of an electronic device, adding a protocol instruction into a protocol instruction acquisition strip of a corresponding protocol master file table; 3. according to the instruction, discomposing to-be-sent content into different sending variable names, sending variable notes and default values, putting the different sending variable names, sending variable notes and default values into a sending variable acquisition strip of a sending variable slave list, and connecting serially and sequentially corresponding default values into a sending command and sending the sending command to the electronic device; 4. after the electronic device receives the sending command, returning data, and after the protocol master file table receives the data, analyzing the data and putting a variable value obtain through analysis into a receiving variable acquisition strip of a receiving variable slave list; and 5. performing verification on an electronic device test logic result according to a variable obtained through analysis. The method provided by the present invention improves compatibility and fastness of testing.

Description

technical field [0001] The invention relates to the technical field of communication, in particular to a general processing method for assembling and testing different electronic devices. Background technique [0002] Electronic equipment and its testing methods are changing with each passing day, and the corresponding software control and testing procedures are also changing rapidly. Generally, the test software that cooperates with the hardware is specially customized, and only for specific equipment or a certain test process. When the process flow is changed, the equipment is upgraded, or the test process is modified, the software will be changed, and the maintenance of the software is large. Not only Causes shortage of manpower, time-consuming, and will affect production. [0003] The traditional technology is to use electronic equipment for testing. Electronic equipment refers to different equipment provided by different manufacturers. The communication method of the e...

AI Technical Summary

Problems solved by technology

Generally, the test software that cooperates with the hardware is specially customized, and only for specific equipment or a certain test process. When the process flow is changed, the equipment is upgraded, or the test process is modified, the software will be changed, and the maintenance of the software is large. Not only Creates understaffing, time consuming and impacts production

[0003] The traditional technology is to use electronic equipment for testing. Electronic equipment refers to different equipment provided by different manufacturers. The communication method of the electronic equipment used in the entire test software system is directly fixed in the software. It can only be used for The current test custom writing method, that is, an electronic device can only be tested by writing a specific test software source code, so that when the external electronic device is replaced, the software source code must be changed and debugged before it can be used, which is more expensive. Time, it is difficult to guarantee efficiency when there is a project schedule requirement, and at the same time, when the entire testing process is changed, the source code of the software must also be changed, and it can only be put into use after debugging and verification, requiring a large amount of human resources for software engineers

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