Array substrate, display panel, display device, large substrate and test method

A technology for array substrates and display panels, applied in nonlinear optics, instruments, optics, etc., can solve problems such as switches being easily damaged, occupying array substrates, and short-circuiting multiple signal lines.

Inactive Publication Date: 2017-08-18
XIAMEN TIANMA MICRO ELECTRONICS
View PDF6 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, the test circuit composed of the above-mentioned contact terminals and lead wires needs to occupy at least 500um of length of the array s

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array substrate, display panel, display device, large substrate and test method
  • Array substrate, display panel, display device, large substrate and test method
  • Array substrate, display panel, display device, large substrate and test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0064] In order to better understand the technical solutions of the present invention, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0065] It should be clear that the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0066] Terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. As used in the embodiments of the present invention and the appended claims, the singular forms "a", "said" and "the" are also intended to include the plural forms unless the context clearly indicates otherwise.

[0067] It should be understood that althoug...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Resistanceaaaaaaaaaa
Resistanceaaaaaaaaaa
Login to view more

Abstract

The embodiment of the invention provides an array substrate, a display panel, a display device, a large substrate and a test method, and relates to the technical field of display equipment. By means of the array substrate, the display panel, the display device, the large substrate and the test method, the occupying space of a test circuit is reduced, and the short-circuit problem caused by damage of a test switch is avoided. The array substrate comprises multiple signal lines, and the end, close to a first edge of the array substrate, of each signal line is connected to the first edge of the array substrate through a first lead; the array substrate further comprises at least one contact terminal and multiple second leads; one ends of the second leads are connected to the contact terminals, and the other ends of the second leads are connected to a second edge of the array substrate; the first edge and the second edge are oppositely arranged. The array substrate is applicable to the display device.

Description

[0001] 【Technical field】 [0002] The present invention relates to the technical field of display equipment, in particular to an array substrate, a display panel, a display device, a large board and a testing method. [0003] 【Background technique】 [0004] In the prior art, such as figure 1 As shown, the display panel 1 includes a plurality of signal lines 30 located in the display area 2 , and after the wiring of the above signal lines is completed, the above signal lines 30 need to be electrically tested. [0005] Currently, the electrical test method for the signal line 30 is as follows: one end of the lead wire 50 is connected to the signal line 30 , and the other end is connected to the contact terminal 40 . When an electrical signal is applied to the contact terminal 40 , the signal line 30 is electrically tested. [0006] During the electrical testing process, the number of contact terminals 40 is much smaller than the number of signal lines 30 due to the larger occupi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G02F1/1362G02F1/13
CPCG02F1/1309G02F1/136286G02F1/136254
Inventor 周洪波
Owner XIAMEN TIANMA MICRO ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap