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A reflectivity detection device and detection method thereof

A technology of detection equipment and reflectivity, which is applied in the field of optical detection, can solve problems that affect the recovery and repeatability of the sample to be tested, the deviation of the placement of the sample to be tested, and the impact on the accuracy of the measurement results, etc., to improve accuracy and reliability Repeatability, improve implementation efficiency, and protect the effect of integrity and safety

Active Publication Date: 2021-01-01
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in actual operation, it is found that when the sample to be tested is small or the measurement area is small, the placement position of the sample to be tested will often deviate and affect the accuracy of the measurement results; at the same time, when the sample to be tested is taken out after the test is completed , after pulling the elastic device, the sample to be tested will slip and cause the sample to be tested to break and even cause personnel scratches, which will affect the recovery and repeatability of the sample to be tested

Method used

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  • A reflectivity detection device and detection method thereof
  • A reflectivity detection device and detection method thereof
  • A reflectivity detection device and detection method thereof

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Embodiment Construction

[0029] The following descriptions are preferred implementations of the embodiments of the present invention. It should be pointed out that those skilled in the art can make some improvements and modifications without departing from the principles of the embodiments of the present invention. These improvements And retouching are also regarded as the scope of protection of the embodiments of the present invention.

[0030] see figure 1 , the embodiment of the present invention provides a reflectivity detection device 100, including a detection box 10 and a tablet holder 20, the detection box 10 includes a light source 11 connected by an optical path, a detection chamber 12 and an integrating sphere unit 13, the The integrating sphere unit 13 is provided with a detection port 14, a through hole 15 is arranged on the side wall of the detection box body 10, the detection port 14 is fixed on the side wall, and the detection port 14 runs through the through hole 15 and flush with th...

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Abstract

The invention provides a reflectivity detection device including a detection box body and a press sheet fixing part. The detection box body comprises a light source, a detection room and an integrating sphere unit in light path communication. A through hole is formed in one side wall of the detection box body, the integrating sphere unit is provided with a detection port, and the detection port isfixed on the side wall and penetrates through the through hole; the press sheet fixing part comprises a press sheet substrate and an adsorption part arranged on one side of the press sheet fixing part; the adsorption part is connected with a negative pressure device; the negative pressure device is used for providing an adsorption force for an adsorption part to fix and adsorb a to-be-measured sample; the adsorption part is movably fitted with the detection port. The invention also provides a detection method for the reflectivity detection device.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to a reflectivity detection device and a detection method thereof. Background technique [0002] At present, LCD panels are widely used in many fields, and the output of LCD panels is also increasing year by year. However, as a high-precision industrial product, LCD panels often need to use UV-Vis spectrophotometer test its transmittance and reflectance parameters. [0003] The transmittance / reflectance test of the sample to be tested (such as glass / sheet, etc.) is to measure the transmittance and reflectance of the sample by using the reflection / diffuse reflection characteristics of light. However, due to the scattering effect of the sample to be measured on the incident beam, the scattered light intensity varies. If it directly enters the detector, it will cause a decrease in the accuracy of the detection result and an increase in noise. Therefore, an integrating sphere...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/01G01N21/552
CPCG01N21/01G01N21/552
Inventor 林虹云王俐夏振宇孙志恒张小新
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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