A frequency shift control method and a super-resolution microscopic imaging method based on the method

Abstract

The invention discloses a frequency shift quantity adjusting and controlling method, and further discloses a super-resolution microimaging method utilizing the frequency shift quantity adjusting and controlling method. The frequency shift quantity adjusting and controlling method comprises the steps: a sample is placed on the surface of a waveguide, and light is input to the waveguide from two ormore different directions simultaneously to generateand interference fringes are generated to waveguide input light simultaneously from two or more different directions to illuminate the sample; and the included angles of the input light in different directions are changed, and the frequency shift quantity is adjusted and controlled. On the basis of a frequency shift quantity adjusting and controlling technology, the super-resolution microimaging method can achieve super-resolution microimaging with all of a large visual field, quickness and the super-high resolution ratio, and has an important significance in the fields such as molecular cytology, biomedicine and material science.

Description

technical field [0001] The invention belongs to the field of frequency-shifting super-resolution microscopic imaging, and in particular relates to a frequency-shifting control method and a super-resolution microscopic imaging method based on the method. Background technique [0002] Large field of view, fast, high-resolution imaging and detection have important practical significance. Frequency shifting technology can break through the bandwidth limitation of traditional imaging and detection devices, and has significant advantages in large field of view and high speed. However, insufficient resolution is the main problem in the current frequency shifting technology, especially in the field of super-resolution microscopy imaging based on frequency shifting. [0003] At present, the resolution of frequency-shifted super-resolution microscopy imaging can only be increased by 2 to 3 times on the basis of the diffraction limit. The fundamental reason for limiting the improveme...

AI Technical Summary

Problems solved by technology

In this technology, the direction of frequency shift can be adjusted by changing the direction of incident illumination, but the amount of frequency shift is determined by the tangential wave vector of the evanescent field and cannot be adjusted; The wave vector cannot be greater than 2 times the cutoff frequency of the objective, thus limiting the achievable resolution

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