Method for grading wheat scab disease

A technology for wheat scab and a grading method is applied in the field of grading methods and devices, and can solve the problems of high requirements on spectral diagnostic instruments and techniques, not applicable to ordinary plant protection personnel or farmers, and large subjective influence of manual visual judgment, etc. Achieve the effect of avoiding uncertain results, improving the accuracy of lesion segmentation, and being suitable for popularization and use.

Active Publication Date: 2019-03-29
安徽黄鹄电子信息技术有限公司
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Problems solved by technology

As one of the main diseases of wheat, head blight is particularly serious in the Jianghuai River Basin in my country. Due to the inability to accurately judge the severity of the disease, it often leads to excessive application of pesticides, which causes great harm to the agricultural ecological environment and seriously affects the national grain. Safety and food safety, therefore, it is particularly important to study wheat scab disease classification methods and diagnostic devices
[0003] At present, the diagnosis of wheat head bligh

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  • Method for grading wheat scab disease
  • Method for grading wheat scab disease
  • Method for grading wheat scab disease

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[0013] Combine below Figure 1 to Figure 3 , the present invention is described in further detail.

[0014] Since there are many formulas in this case, the subscript is only for a certain formula, and the same subscripts in different formulas do not necessarily mean the same.

[0015] refer to figure 1 , a wheat head blight disease grade classification method, comprising the following steps: (A) non-destructive, non-destructive acquisition of the original image of a single ear; The operation obtains the binarized image, and black represents the background in this figure, and white represents the single ear region; (C) combine the original image and the binarized image obtained in step B to obtain an RGB image; (D) convert the RGB image to In Lab color space, IABC-K-PCNN method is used to process the a-channel grayscale image to obtain a binary scab lesion map of single ear scab. In this picture, 0 represents the lesion area and background, and 1 represents normal single ear ...

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Abstract

The invention particularly relates to a method for grade wheat scab disease, which comprises that follow steps: (A) acquiring an original image; B) carrying out grayscale processing, binarization processing, and opening and closing operation on that original image in turn, and obtaining a binary image; (c) combining that original image and the binary image; (D) Convertting to Lab color space, using IABC-K-PCNN method to process the a-channel gray scale image to obtain binary single-spike scab lesion pattern. (e) calculating a single ear area S1 and a lesion area S2, and then calculating a ratio R of that single ear area S1 and the lesion area S2; (F) according to the national standard, the ratio R, grading the disease of the single ear and outputting the disease grade; A grading device isalso disclosed. The disease grade grading method provided by the invention is tested by a large number of samples and is not destructive in sampling in field investigation of wheat scab, and has the advantages of reliable grading accuracy and high popularization value.

Description

technical field [0001] The invention relates to the technical field of wheat scab diagnosis, in particular to a method and device for grading wheat scab disease. Background technique [0002] As a traditional agricultural country, wheat occupies a very important position in my country's food security. As one of the main diseases of wheat, head blight is particularly serious in the Jianghuai River Basin in my country. Due to the inability to accurately judge the severity of the disease, it often leads to excessive application of pesticides, which causes great harm to the agricultural ecological environment and seriously affects the national grain. Safety and food safety, therefore, it is particularly important to study wheat scab disease classification methods and diagnostic devices. [0003] At present, the diagnosis of wheat head blight mostly adopts artificial visual judgment, spectral diagnosis, conventional image processing and other methods. These methods have some shor...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06N3/00
CPCG06N3/006G06T7/00G06T2207/10004G06T2207/30188
Inventor 张东彦王道勇梁栋徐超黄林生程志友赵晋陵翁世状
Owner 安徽黄鹄电子信息技术有限公司
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