A circuit system fault-tolerant capability simulation analysis method considering cascade failure

A cascading failure, circuit system technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc.

Active Publication Date: 2019-06-28
BEIHANG UNIV +1
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  • Abstract
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  • A circuit system fault-tolerant capability simulation analysis method considering cascade failure
  • A circuit system fault-tolerant capability simulation analysis method considering cascade failure
  • A circuit system fault-tolerant capability simulation analysis method considering cascade failure

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[0051] Exemplary embodiments, features, and aspects of the present invention will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0052] A circuit system fault tolerance simulation analysis method considering cascading failures of the present invention, such as figure 1 As shown, it includes the following steps:

[0053] S1: Analyze the structure and function of the selected circuit system, and number all components and their pin connection points in the circuit system;

[0054] S2: According to the number given by S1, convert the circuit system into a netlist file that needs to be input by SPICE simulation software;

[0055] S3: According to the types and models of all components in the circuit system, set the f...

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Abstract

The invention provides a circuit system fault-tolerant capability simulation analysis method considering cascade failure. The circuit system fault-tolerant capability simulation analysis method comprises the steps of S1, realizing structure and function analysis; S2, constructing a netlist file; S3, constructing a failure description file; S4, carrying out initial injection failure; S5, calling the SPICE for simulation; S6, judging whether cascade failure occurs or not, if the cascade failure occurs, updating the circuit structure information and returning to the step S2, and if the cascade failure does not occur, considering that the cascade failure process is stopped; S7, collecting relevant data of a cascade failure propagation path; S8, carrying out redundancy backup on the key components according to a cascade failure analysis result in the step S7; and S9, updating the circuit structure, and recalculating the improvement degree of the fault-tolerant capability of the improved anddesigned circuit. Simulation calculation analysis is carried out based on SPICE simulation software, cascade failure propagation behaviors of the circuit system can be analyzed from the perspective of the system, fault-tolerant design of the circuit system is guided, and method support is provided for circuit internal structure optimization and reconstruction.

Description

technical field [0001] The invention relates to the technical field of circuit system fault-tolerant design, in particular to a circuit system fault-tolerant simulation analysis method considering cascade failure. Background technique [0002] Circuit systems are widely used in aerospace, intelligent manufacturing, rail transit and other fields. At present, with the rapid development of electronic technology, the underlying components generally have the characteristics of high reliability and long life, but as a circuit system composed of many components, it is usually difficult to meet the requirements of high reliability and long life. Analyzing the reasons, it is mainly due to the complex internal structure and functional coupling characteristics that the failure of internal components in the circuit system does not exist independently. The failures of components often exist in correlation, and the most important form is cascading failure. It is precisely because of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 陈云霞卢震旦金毅何小斌
Owner BEIHANG UNIV
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