A high and low temperature experimental device for electronic components

A technology for experimental devices and electronic components, which is used in measurement devices, instruments, scientific instruments, etc., can solve the problems of less research on thermal fatigue behavior of solder joints, and achieve the effects of simple structure, uniform temperature, and increased heating and cooling rates.

Active Publication Date: 2021-09-24
CHONGQING UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are still few studies on the thermal fatigue behavior of solder joints using accelerated thermal cycling, especially in the development and utilization of equipment.

Method used

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  • A high and low temperature experimental device for electronic components
  • A high and low temperature experimental device for electronic components
  • A high and low temperature experimental device for electronic components

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0028] see Figure 1 to Figure 6 , the high and low temperature experimental device for electronic components shown includes a box body 1, a rotating disk 5 and a motor 6, and a heat insulation board 2 is arranged in the middle of the box body 1, and the heat insulation board 2 divides the box body 1 into a heating chamber above and cooling chamber 4 below 3, the rotating disc 5 is arranged in the box body 1 and its plane is perpendicular to the heat shield 2, a part is in the heating chamber 3, and the other part is in the cooling chamber 4, the disc surface of the rotating disc A mounting boss 51 for placing the sample 10 is provided. The rotating rod 61 of the motor 6 extends into the box body 1 and connects with the center of the rotating disk 5 , and the sample 10 switches between the heating chamber 3 and the cooling chamber 4 driven by the rotating disk 5 . ...

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PUM

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Abstract

The invention discloses a high and low temperature experimental device for electronic components, which includes a box body, a rotating disk and a motor. The box body is provided with a heat insulation board, and the heat insulation board separates the box body into an upper heating chamber and a lower cooling chamber. , the rotating disk is set in the box, the surface of the disk passes through the heat shield vertically, one part is in the heating chamber, and the other part is in the cooling chamber, the surface of the rotating disk is provided with a mounting boss for placing the sample, so The rotating rod of the motor extends into the box and connects with the center of the rotating disk, and the sample is switched between the heating chamber and the cooling chamber driven by the rotating disk. It can improve heating and cooling efficiency, reduce heat preservation time, and respond quickly to temperature changes, uniform heating and cooling, and improve the efficiency of high and low temperature experiments.

Description

technical field [0001] The invention relates to electronic component reliability testing equipment, in particular to an electronic component high and low temperature experimental device. Background technique [0002] At present, with the gradual promotion and application of high-power devices, the packaging density is getting higher and higher, the size of solder joints is getting smaller and larger, the internal electric power of components is getting larger, and the heat flux density is getting higher and higher. Cooling and cooling due to its performance, component solder joints will be subjected to high-frequency and sharp temperature changes during service, which will inevitably lead to mismatch of thermal expansion coefficients of various materials inside components, and solder joints that play a connecting role are subject to stress and strain The cyclic changes of the solder joints will cause thermal fatigue damage of the solder joints, resulting in the failure of th...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01N3/60G01N3/02
CPCG01N3/02G01N3/60
Inventor杨栋华施雷张春红张海兵陈新年翟翔田将夏大权
OwnerCHONGQING UNIV OF TECH