A method and device for testing storage device and device

A technology for storing equipment and equipment information, applied in the storage field, can solve problems such as long time period, prolonging the test period, and storage equipment testing not up to standard, so as to improve the testing efficiency, simplify the testing process, and avoid the effect of manual automatic correction

Active Publication Date: 2021-06-29
SHENZHEN DEMINGLI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Existing solutions for testing storage devices generally integrate multiple testing software and testing processes, and use one-key test operations to test storage devices. There are many items and procedures for testing storage devices. , all need to be manually enabled one by one. If manual operation errors such as omission of test items and process items may result in substandard testing of the storage device, the test cycle will be extended, and the results of the test of the storage device need to be manually tested. Manual recording, longer time period

Method used

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  • A method and device for testing storage device and device
  • A method and device for testing storage device and device
  • A method and device for testing storage device and device

Examples

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example

[0062] Obtain the instance ID (InstanceID) and device path (DevicePath) information of the storage device;

[0063] Obtain the tree results of storage devices, and get all linked storage devices and storage device key name (DeviceKeyName) information;

[0064] Obtain storage device key names and instance ID information of all storage devices in the registry;

[0065] Compare the obtained instance ID and device path information of the storage device, the obtained all linked storage devices and storage device key name information, and the obtained storage device key names and instance ID information of all storage devices in the registry , compare to get the type information of the real storage device;

[0066] According to the type information of the real storage device obtained by the comparison, send the cmd (command, command prompt) of the storage device to obtain the capacity information of the storage device. The advantage of this is that the type information and capacity...

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Abstract

The invention discloses a method, device and equipment for testing storage equipment. Wherein, the method includes: obtaining the device information of the storage device, and according to the obtained device information, setting a target for testing the storage device, and according to the set target, a general software guides and enables the set testing software and tools , start the planned test items and processes, and according to the opened planned test items and processes, a total software guides and activates the set test software and tools to test the storage device, and obtains all the control handles in the window of the storage device, Obtain the test result of the storage device, and generate a test report for the test of the storage device according to the obtained test result. Through the above method, it is possible to simplify the test process for testing the storage device, avoid manual automatic testing of the storage device, improve test efficiency, and have high accuracy of test results.

Description

technical field [0001] The present invention relates to the technical field of storage, in particular to a method, device and equipment for testing a storage device. Background technique [0002] A storage device is a device used to store information, usually digitized and then stored using electrical, magnetic or optical media. [0003] After the storage device is generated, it generally goes through two processes: mass production and testing. Mass production, that is, the mass production software sends commands through the main control chip, writes and reads the physical data of the storage wafer, and obtains the physical good blocks and bad blocks, and then counts and sorts the good physical data blocks to obtain the sorting After the logical data storage block process. Test, that is, conduct a comprehensive test process on the data, format, attributes, storage methods, writing and reading methods of the logical storage unit after mass production, so as to obtain the pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG11C29/56
Inventor 李虎李正
Owner SHENZHEN DEMINGLI ELECTRONICS
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