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Trace element X-ray fluorescence determination method and device and electronic equipment

A technology for trace elements and fluorescence determination, which is applied in the direction of measuring devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of accumulation pulse interference, high background, low precision, etc., to improve detection accuracy, suppress Effects of stacking pulses and improving elemental accuracy

Pending Publication Date: 2021-12-21
台州高视通智能科技有限公司
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Problems solved by technology

[0005] The purpose of the embodiment of the present application is to provide a trace element X-ray fluorescence measurement method, device, and electronic equipment to solve the technical problems of accumulation pulse interference, low precision, and high background in the related art

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  • Trace element X-ray fluorescence determination method and device and electronic equipment
  • Trace element X-ray fluorescence determination method and device and electronic equipment
  • Trace element X-ray fluorescence determination method and device and electronic equipment

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Embodiment Construction

[0035] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present application as recited in the appended claims.

[0036] The terminology used in this application is for the purpose of describing particular embodiments only, and is not intended to limit the application. As used in this application and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood that the term...

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Abstract

The invention discloses a trace element X-ray fluorescence determination method and device, electronic equipment and a medium. The method comprises the following steps: obtaining a fluorescence spectrum data set obtained by collecting a standard substance by a spectrograph, arranging a sheet between an X-ray tube of the spectrograph and the standard substance, and the sheet being a metal sheet capable of inhibiting stacked pulses; processing the fluorescence spectrum data set by using a background scattering internal standard method; according to the processed fluorescence spectrum data set and the corresponding trace element content of the standard substance, establishing a trace element detection calibration model based on the standard substance; inputting fluorescence spectrum data of a sample to be detected into the detection calibration model to obtain the content of the trace elements in the sample.

Description

technical field [0001] The present application relates to the field of trace element detection, in particular to a trace element X-ray fluorescence measurement method and device, and electronic equipment. Background technique [0002] The known detection of fine and trace element content has been realized in spectroscopic technologies such as direct reading spectrometer, glow power mass spectrometer, and inductively coupled plasma mass spectrometry. [0003] Although these methods have very high precision, detection limit and sensitivity in the detection of trace elements in alloys, direct reading spectrometers use prisms and dispersive elements; glow discharge mass spectrometry uses a glow discharge source as an ion source and is connected to a mass spectrometer for mass spectrometry Determination; the sampling system of inductively coupled plasma mass spectrometry is very strict and equipped with a vacuum device. These characteristics make these measurement methods realiz...

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Application Information

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IPC IPC(8): G01N23/223
CPCG01N23/223
Inventor 郝军李福生江晓宇王清亚徐磊陈凯伟
Owner 台州高视通智能科技有限公司
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