SITEMAP graph adding method

A MAP map, one-to-one correspondence technology, applied in the field of wafer testing, can solve problems such as long time-consuming and error-prone, and achieve the effect of less error-prone, fast and accurate statistics

Pending Publication Date: 2022-05-27
上海利扬创芯片测试有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This means that when counting a batch of data, it is first necessary to export the actual test map from the MES system, and then open the SITE MAP map for manual comparison, which takes too l

Method used

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  • SITEMAP graph adding method
  • SITEMAP graph adding method
  • SITEMAP graph adding method

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Embodiment Construction

[0031] In order to make the purposes, technical solutions, and advantages of the embodiments of the present invention clearer, the following will be combined with the appendixes in the embodiments of the present invention. Figure 1 to Figure 5 , clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. The components of the embodiments of the invention generally described and illustrated in the drawings herein may be arranged and designed in a variety of different configurations.

[0032] Thus, the following detailed description of the embodiments of the invention provided in the accompanying drawings are not intended to limit the scope of the invention as claimed, but are merely representative of selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtai...

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Abstract

The invention discloses a method for adding an SITE MAP graph. The method comprises the following steps: S100, importing an SITE MAP graph file; s200, a probe file is imported; and S300, according to the imported SITE MAP file and the probe file, the SITE MAP file and the probe file are compared, and after comparison, a new standard MAP file is generated. Compared with the prior art, the method has the advantages that the manual file comparison method in the prior art is abandoned, and compared with the prior art, the method is quicker and more convenient, is not easy to make mistakes, and is convenient for operators to quickly and accurately count.

Description

technical field [0001] The invention belongs to the field of wafer testing, and particularly relates to a method for adding a map to a SITE MAP. Background technique [0002] The main purpose of wafer testing is to not package the tested bad chips, thereby reducing packaging costs. In the field of wafer testing, the probe card (Probe card) is the medium between the wafer and the tester. The probe card is usually placed directly on the probe station prober and connected to the tester with wires. The purpose of the probe card is to provide the connection between the chip and the tester, and to complete the wafer test. A probe card is a custom connector with a common pattern, and it is usually necessary to provide targeted probe cards for different types of wafers. [0003] figure 1 It is a working schematic diagram of the wafer testing link in the prior art. During wafer testing, the SITE information of different types of probe cards is different, and the yields between d...

Claims

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Application Information

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IPC IPC(8): G06F40/194G06F16/335G06T11/20G01R31/28H01L21/66
CPCG06F40/194G06F16/335G06T11/206H01L22/14G01R31/28
Inventor 朱思琴张钦祥陈聪
Owner 上海利扬创芯片测试有限公司
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