600-700nm band fourier transform infrared photoluminescence spectrum measuring method and apparatus

A technology of Fourier transform and photoluminescence spectroscopy, which is applied in the field of photoluminescence characteristics testing of visible/near-infrared optoelectronic materials, can solve problems affecting the reliable acquisition of photoluminescence spectra, achieve laser interference elimination, high signal-to-noise ratio, effective Facilitate the effect of extraction and identification

Active Publication Date: 2006-07-19
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0003] However, in the visible / near-infrared band, due to the interference of the helium-neon (He-Ne) laser (wavelength 632.8nm) used for optical path collimation and sampling control inside the Fourier transform infrared spectrometer, the band range around 600-700nm is seriously affected. Reliable acquisition of internal photoluminescence spectra

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  • 600-700nm band fourier transform infrared photoluminescence spectrum measuring method and apparatus
  • 600-700nm band fourier transform infrared photoluminescence spectrum measuring method and apparatus
  • 600-700nm band fourier transform infrared photoluminescence spectrum measuring method and apparatus

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[0022] The following is based on Figure 1-Figure 2 The preferred embodiments of the present invention are given and described in detail, which can better illustrate the technical features and functional characteristics of the present invention.

[0023] from figure 1 It can be seen that the modulated photoluminescence spectrum measurement device of the present invention includes - a laser 3, which generates pump laser light; - a Fourier transform infrared spectroscopy system 1, which has a Fourier transform infrared spectrometer 10 and a Fourier transform infrared spectroscopy matched thereto. Computer 20, the spectrometer 10 has a sample holder 101 for placing the sample 4, an interferometer part 102 for receiving the photoluminescence signal of the sample 4, the moving mirror 1026 in the part 102 is placed in a step-and-scan state, and the signal passes through the interferometer part 102 The detector 103 that is sent into after Fourier transform, and the circuit control b...

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Abstract

The invention discloses a method and apparatus of 600-700nm wave range Fourier transform photo-induced luminous spectrum. The apparatus comprises a Fourier transform infrared spectrograph measuring system, a laser used as active light source, a lock-in amplifier which connects the Fourier transform infrared spectrograph detector and the circuit controlling plate and a circuit-breaker on the light path between the sample and the laser, so that it can transfer the constant active light into the modulated active light and feedback it in the reference end of the lock-in amplifier to control the lock-in.

Description

technical field [0001] The invention relates to a method and a device for testing photoluminescence characteristics of visible / near-infrared optoelectronic materials, specifically, a method and a device for Fourier transform (FTIR) photoluminescence spectrum in a band near 600-700nm. Background technique [0002] Photoluminescence spectroscopy based on Fourier transform infrared spectrometer is an advanced method to study the photoelectric properties of infrared semiconductor materials. information. [0003] However, in the visible / near-infrared band, due to the interference of the helium-neon (He-Ne) laser (wavelength 632.8nm) used for optical path collimation and sampling control inside the Fourier transform infrared spectrometer, the band range around 600-700nm is seriously affected. Reliable acquisition of internal photoluminescence spectra. And it happens that there are very important semiconductor optoelectronic materials in this band, such as InGaP quantum wells use...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64G01N21/27
Inventor 邵军陆卫越方禹吕翔李志锋郭少令褚君浩
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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