The present invention discloses a
semiconductor device
driving circuit and a test method thereof, comprising a
comparator A1, a first
resistor R1, a second
resistor R2 and a
light emitting diode group. In the present invention, when a
light emitting diode is short-circuited or damaged, the elastic force of the
torsion spring rebounds, the
torsion spring drives the entire placement frame to rotate
clockwise by using the clamp head, and the spring elastic force pulls back, so that the two
extrusion plates gradually move away from each other, at which time the connecting
pipe returns to its original state, the connection pressure between the connecting
pipe and the
light emitting diode is reduced, the placement frame rotates
clockwise inside the screw groove by using the screw strip, and the elastic force of the
torsion spring causes the placement frame to move up during the rotation process, until the screw strip is separated from the screw groove, the elastic force of the torsion spring bounces the entire placement frame from the inside of the through groove, so that the damaged light emitting
diode can be directly taken out from the test device, the continuity of the test of multiple light emitting diodes is ensured, and the accuracy of the test of the remaining light emitting diodes is improved at the same time.